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Digital communications test and measurement : high-speed physical layer characterization /
| Clasificación: | Libro Electrónico |
|---|---|
| Otros Autores: | , |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Upper Saddle River, N.J. :
Prentice Hall,
©2008.
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| Colección: | Prentice Hall modern semiconductor design series. Prentice Hall signal integrity library.
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| Temas: | |
| Acceso en línea: | Texto completo (Requiere registro previo con correo institucional) |
Tabla de Contenidos:
- Ch. 1. Fundamentals of Digital Communications Systems
- Ch. 2. Jitter Basics
- Ch. 3. Serial Communication Systems and Modulation Codes
- Ch. 4. Bit Error Ratio Testing
- Ch. 5. BERT Scan Measurements
- Ch. 6. Waveform Analysis
- Real-Time Scopes
- Ch. 7. Characterizing High-Speed Digital Communications Signals and Systems with the Equivalent-Time Sampling Oscilloscope
- Ch. 8. High-Speed Waveform Analysis Using All-Optical Sampling
- Ch. 9. Clock Synthesis, Phase Locked Loops, and Clock Recovery
- Ch. 10. Jitter Tolerance Testing
- Ch. 11. Sensitivity Testing in Optical Digital Communications
- Ch. 12. Stress Tests in High-Speed Serial Links
- Ch. 13. Measurements on Interconnects
- Ch. 14. Frequency Domain Measurements
- Ch. 15. Jitter and Signaling Testing for Chip-to-Chip Link Components and Systems
- App. A. Pseudo-Random Binary Sequences
- App. B. Passive Elements for Test Setups
- App. C. Coaxial Cables and Connectors
- App. D. Supplemental Materials for Chapter 3.