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Digital logic testing and simulation /
The increase in the size and complexity of circuits on a chip with little or no increase in the number of Input/Output pins has made the need for testing ever more important. The test must detect failures in individual units, as well as failures caused by defective manufacturing processes. Random de...
| Clasificación: | Libro Electrónico |
|---|---|
| Autor principal: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Hoboken, NJ :
Wiley-Interscience,
©2003.
|
| Edición: | 2nd ed. |
| Temas: | |
| Acceso en línea: | Texto completo (Requiere registro previo con correo institucional) |
MARC
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| 100 | 1 | |a Miczo, Alexander. | |
| 245 | 1 | 0 | |a Digital logic testing and simulation / |c Alexander Miczo. |
| 250 | |a 2nd ed. | ||
| 260 | |a Hoboken, NJ : |b Wiley-Interscience, |c ©2003. | ||
| 300 | |a 1 online resource (xxii, 673 pages) : |b illustrations | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 504 | |a Includes bibliographical references and index. | ||
| 505 | 0 | |a Introduction -- Simulation -- Fault Simulation -- Automatic Test Pattern Generation -- Sequential Logic Test -- Automatic Test Equipment -- Developing a Test Strategy -- Design-For-Testability -- Built-In Self-Test -- Memory Test -- I(DDQ) -- Behavioral Test and Verification. | |
| 520 | |a The increase in the size and complexity of circuits on a chip with little or no increase in the number of Input/Output pins has made the need for testing ever more important. The test must detect failures in individual units, as well as failures caused by defective manufacturing processes. Random defects that go undetected may result in expensive recalls and also endanger the public, since digital logic devices have become pervasive in products that affect public safety, including applications such as transportation and human implants among others. This thoroughly revised edition of the author. | ||
| 588 | 0 | |a Print version record. | |
| 590 | |a O'Reilly |b O'Reilly Online Learning: Academic/Public Library Edition | ||
| 650 | 0 | |a Digital electronics |x Testing. | |
| 650 | 7 | |a TECHNOLOGY & ENGINEERING |x Electronics |x Circuits |x Integrated. |2 bisacsh | |
| 650 | 7 | |a TECHNOLOGY & ENGINEERING |x Electronics |x Circuits |x General. |2 bisacsh | |
| 650 | 7 | |a Digital electronics |x Testing. |2 fast |0 (OCoLC)fst00893685 | |
| 653 | |a Circuit theory and design / vlsi / ulsi |a Computer engineering. | ||
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