Cargando…
Power integrity : measuring, optimizing, and troubleshooting power related parameters in electronics systems /
Proven techniques for generating high-fidelity measurements. Power Integrity: Measuring, Optimizing, and Troubleshooting Power Related Parameters in Electronics Systems provides field-tested techniques for producing high-fidelity measurements using the appropriate equipment. The book thoroughly disc...
| Clasificación: | Libro Electrónico |
|---|---|
| Autor principal: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
New York, N.Y. :
McGraw-Hill Education,
[2014]
|
| Edición: | First edition. |
| Colección: | McGraw-Hill's AccessEngineering.
|
| Temas: | |
| Acceso en línea: | Texto completo |
Tabla de Contenidos:
- A. About the author
- B. Dedication
- C. Acknowledgments
- 1. Introduction
- What you will learn from this book
- Who will benefit from this book
- The general format of this book
- 2. Measurement philosophy
- Cause no damage
- Measure without influencing the measurement
- Validate the test setup and measurement limits
- Measure in the most efficient and direct way
- Document measurements thoroughly
- 3. Measurement fundamentals
- Sensitivity
- Noise floor
- Dynamic range
- Noise density
- Signal averaging
- Scaling
- Attenuators
- Preamplifiers
- Measurement domains
- Endnotes
- 4. Test instruments
- Frequency response analyzers and vector network analyzers
- Oscilloscopes
- Spectrum analyzers
- Signal generators
- Tdr/tdt s-parameter analyzers
- 5. Probes, injectors, and interconnects
- Voltage probes
- Endnotes
- 6. The distributed system
- Noise paths within a voltage regulator
- Control loop stability
- How poor stability propagates through the system
- Endnotes
- 7. Measuring impedance
- Selecting a measurement method
- Endnotes
- 8. Measuring stability
- Stability and why it matters
- Endnotes
- 9. Measuring psrr
- Measurement methods
- Modulating the input
- Choosing the measurement domain
- Endnotes
- 10. Reverse transfer and crosstalk
- Reverse transfer of various topologies
- Modulating the output current
- Measuring the input current
- Measuring the input voltage
- Indirect measurement
- Endnotes
- 11. Measuring step load response
- Generating the transient
- Measuring the response(s)
- Endnotes
- 12. Measuring ripple and noise
- Selecting a measurement method
- Connecting the equipment
- Choosing the equipment
- Averaging and filtering
- Endnotes
- 13. Measuring edges
- Relating bandwidth and rise time
- Sampling rate and interleaved sampling
- Interpolation
- Coaxial cables
- The criticality of the probe connection
- Printed circuit board issues
- Probes
- Endnotes
- 14. Troubleshooting with near-field probes
- The basics of emissions
- The near-field probes
- Probe and orientation
- The measurement instrument
- Spectrum gating
- Endnotes
- 15. High-frequency impedance measurement
- Time domain
- Calibration
- Reference plane
- Setting tdr pulse rise time
- Interpreting tdr measurements
- Estimating inductance and capacitance
- S-parameter measurements
- Endnotes.