Power integrity : measuring, optimizing, and troubleshooting power related parameters in electronics systems /

Proven techniques for generating high-fidelity measurements. Power Integrity: Measuring, Optimizing, and Troubleshooting Power Related Parameters in Electronics Systems provides field-tested techniques for producing high-fidelity measurements using the appropriate equipment. The book thoroughly disc...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Sandler, Steven M. (Autor)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: New York, N.Y. : McGraw-Hill Education, [2014]
Edición:First edition.
Colección:McGraw-Hill's AccessEngineering.
Temas:
Electric power supplies to apparatus.
Electronics.
Electronic books.
Acceso en línea:Texto completo

MARC

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020 |a 9780071830997 (print-ISBN) 
020 |a 0071830995 (print-ISBN) 
035 |a (OCoLC)903347083 
040 |a IN-ChSCO  |b eng  |e rda 
041 0 |a eng 
050 4 |a TK7881.15 
082 0 4 |a 621.381/044  |2 23 
100 1 |a Sandler, Steven M.,  |e author. 
245 1 0 |a Power integrity :  |b measuring, optimizing, and troubleshooting power related parameters in electronics systems /  |c Steven M. Sandler. 
250 |a First edition. 
264 1 |a New York, N.Y. :  |b McGraw-Hill Education,  |c [2014] 
264 4 |c ?2014 
300 |a 1 online resource (xv, 335 pages) :  |b illustrations. 
336 |a text  |2 rdacontent 
337 |a computer  |2 rdamedia 
338 |a online resource  |2 rdacarrier 
490 1 |a McGraw-Hill's AccessEngineering 
504 |a Includes bibliographical references and index. 
505 0 |a A. About the author -- B. Dedication -- C. Acknowledgments -- 1. Introduction -- What you will learn from this book -- Who will benefit from this book -- The general format of this book -- 2. Measurement philosophy -- Cause no damage -- Measure without influencing the measurement -- Validate the test setup and measurement limits -- Measure in the most efficient and direct way -- Document measurements thoroughly -- 3. Measurement fundamentals -- Sensitivity -- Noise floor -- Dynamic range -- Noise density -- Signal averaging -- Scaling -- Attenuators -- Preamplifiers -- Measurement domains -- Endnotes -- 4. Test instruments -- Frequency response analyzers and vector network analyzers -- Oscilloscopes -- Spectrum analyzers -- Signal generators -- Tdr/tdt s-parameter analyzers -- 5. Probes, injectors, and interconnects -- Voltage probes -- Endnotes -- 6. The distributed system -- Noise paths within a voltage regulator -- Control loop stability -- How poor stability propagates through the system -- Endnotes -- 7. Measuring impedance -- Selecting a measurement method -- Endnotes -- 8. Measuring stability -- Stability and why it matters -- Endnotes -- 9. Measuring psrr -- Measurement methods -- Modulating the input -- Choosing the measurement domain -- Endnotes -- 10. Reverse transfer and crosstalk -- Reverse transfer of various topologies -- Modulating the output current -- Measuring the input current -- Measuring the input voltage -- Indirect measurement -- Endnotes -- 11. Measuring step load response -- Generating the transient -- Measuring the response(s) -- Endnotes -- 12. Measuring ripple and noise -- Selecting a measurement method -- Connecting the equipment -- Choosing the equipment -- Averaging and filtering -- Endnotes -- 13. Measuring edges -- Relating bandwidth and rise time -- Sampling rate and interleaved sampling -- Interpolation -- Coaxial cables -- The criticality of the probe connection -- Printed circuit board issues -- Probes -- Endnotes -- 14. Troubleshooting with near-field probes -- The basics of emissions -- The near-field probes -- Probe and orientation -- The measurement instrument -- Spectrum gating -- Endnotes -- 15. High-frequency impedance measurement -- Time domain -- Calibration -- Reference plane -- Setting tdr pulse rise time -- Interpreting tdr measurements -- Estimating inductance and capacitance -- S-parameter measurements -- Endnotes. 
520 0 |a Proven techniques for generating high-fidelity measurements. Power Integrity: Measuring, Optimizing, and Troubleshooting Power Related Parameters in Electronics Systems provides field-tested techniques for producing high-fidelity measurements using the appropriate equipment. The book thoroughly discusses measurement guidelines, test instrument selection and use, connecting the equipment to the device being tested, and interpreting the acquired data. The latest electronics technologies and their impact on measurement are discussed. Detailed photographs, screenshots, schematics, and equations are included throughout this practical guide. Learn how to accurately measure: Impedance, Stability, Power supply rejection ratio (PSRR), Reverse transfer and crosstalk, Step load response, Ripple and noise, Edges, High-frequency impedance. 
530 |a Also available in print edition. 
533 |a Electronic reproduction.  |b New York, N.Y. :  |c McGraw Hill,   |d 2014.  |n Mode of access: World Wide Web.  |n System requirements: Web browser.  |n Access may be restricted to users at subscribing institutions. 
538 |a Mode of access: Internet via World Wide Web. 
546 |a In English. 
588 |a Description based on cover image and table of contents, viewed on Jan. 20, 2015. 
650 0 |a Electric power supplies to apparatus. 
650 0 |a Electronics. 
655 0 |a Electronic books. 
776 0 |i Print version:   |t Power integrity : measuring, optimizing, and troubleshooting power related parameters in electronics systems.  |b First edition.  |d New York, N.Y. : McGraw-Hill Education, 2014  |w (OCoLC)864847616 
830 0 |a McGraw-Hill's AccessEngineering. 
856 4 0 |u https://accessengineeringlibrary.uam.elogim.com/content/book/9780071830997  |z Texto completo 

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