Nanoscale CMOS VLSI circuits : design for manufacturability /

Covering the latest devices; technologies; and processes; this detailed guide offers proven methods for optimizing circuit designs to increase the yield; reliability; and manufacturability of products and mitigate defects and failure.

Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Kundu, Sandip (Autor)
Otros Autores: Sreedhar, Aswin, Penn, Michael, Fogarty, David E., Darnell, Matt
Formato: Electrónico eBook
Idioma:Inglés
Publicado: New York, N.Y. : McGraw-Hill Education, [2011]
Edición:First edition.
Colección:McGraw-Hill's AccessEngineering.
Temas:
Metal oxide semiconductors, Complementary > Design and construction.
Integrated circuits > Very large scale integration > Design and construction.
Electronic books.
Acceso en línea:Texto completo
Tabla de Contenidos:
  • Semiconductor manufacturing
  • Process and device variability : analysis and modeling
  • Manufacturing-aware physical design closure
  • Metrology, manufacturing defects, and defect extraction
  • Defect impact modeling and yield improvement techniques
  • Physical design and reliability
  • Design for manufacturability : tools and methodologies.

Ejemplares similares