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X-Ray Nanoimaging: Instruments and Methods V
Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature. The papers in this volume were part of the technical conference on X-Ray Nanoimaging: Instruments and Methods V held on 1-5 August 2021, San Diego, Cali...
| Clasificación: | Libro Electrónico |
|---|---|
| Formato: | Electrónico eBook |
| Idioma: | Indeterminado |
| Publicado: |
SPIE / International Society for Optical Engineering
2021.
|
| Temas: | |
| Acceso en línea: | Texto completo |
MARC
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| 520 | |a Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature. The papers in this volume were part of the technical conference on X-Ray Nanoimaging: Instruments and Methods V held on 1-5 August 2021, San Diego, California, United States. | ||
| 590 | |a Knovel |b ACADEMIC - Optics & Photonics | ||
| 590 | |a Knovel |b ACADEMIC - General Engineering & Project Administration | ||
| 650 | 0 | |a X-ray microscopy. | |
| 650 | 0 | |a X-ray optics. | |
| 650 | 6 | |a Microscopie à rayons X. | |
| 650 | 6 | |a Optique des rayons X. | |
| 650 | 7 | |a X-ray microscopy |2 fast | |
| 650 | 7 | |a X-ray optics |2 fast | |
| 773 | 0 | |t Online access: SPIE - The International Society for Optical Engineering SPIE Digital Library - Conference Proceedings. | |
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