Introduction to scanning tunneling microscopy /
The scanning tunnelling microscope (STM) was invented by Binnig and Rohrer and received a Nobel Prize of Physics in 1986. Together with the atomic force microscope (AFM), it provides non-destructive atomic and subatomic resolution on surfaces. Especially, in recent years, internal details of atomic...
Clasificación: | Libro Electrónico |
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Autor principal: | |
Formato: | Electrónico eBook |
Idioma: | Inglés |
Publicado: |
Oxford :
Oxford University Press,
2021.
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Edición: | Third edition. |
Colección: | Monographs on the physics and chemistry of materials ;
69. |
Temas: | |
Acceso en línea: | Texto completo |
Tabla de Contenidos:
- Tunneling phenomenon
- Tunneling matrix elements
- Atomic forces
- Atomic forces and tunneling
- Nanometer-scale imaging
- Atomic-scale imaging
- Imaging wavefunctions
- Nanomechanical eects
- Piezoelectric scanner
- Vibration isolation
- Electronics and control
- Mechanical design
- Tip treatment
- Scanning tunneling spectroscopy
- Atomic force microscopy.