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Introduction to scanning tunneling microscopy /

The scanning tunnelling microscope (STM) was invented by Binnig and Rohrer and received a Nobel Prize of Physics in 1986. Together with the atomic force microscope (AFM), it provides non-destructive atomic and subatomic resolution on surfaces. Especially, in recent years, internal details of atomic...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Chen, C. Julian (Autor)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Oxford : Oxford University Press, 2021.
Edición:Third edition.
Colección:Monographs on the physics and chemistry of materials ; 69.
Temas:
Acceso en línea:Texto completo
Tabla de Contenidos:
  • Tunneling phenomenon
  • Tunneling matrix elements
  • Atomic forces
  • Atomic forces and tunneling
  • Nanometer-scale imaging
  • Atomic-scale imaging
  • Imaging wavefunctions
  • Nanomechanical eects
  • Piezoelectric scanner
  • Vibration isolation
  • Electronics and control
  • Mechanical design
  • Tip treatment
  • Scanning tunneling spectroscopy
  • Atomic force microscopy.