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Introduction to scanning tunneling microscopy /

The scanning tunnelling microscope (STM) was invented by Binnig and Rohrer and received a Nobel Prize of Physics in 1986. Together with the atomic force microscope (AFM), it provides non-destructive atomic and subatomic resolution on surfaces. Especially, in recent years, internal details of atomic...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Chen, C. Julian (Autor)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Oxford : Oxford University Press, 2021.
Edición:Third edition.
Colección:Monographs on the physics and chemistry of materials ; 69.
Temas:
Acceso en línea:Texto completo
Descripción
Sumario:The scanning tunnelling microscope (STM) was invented by Binnig and Rohrer and received a Nobel Prize of Physics in 1986. Together with the atomic force microscope (AFM), it provides non-destructive atomic and subatomic resolution on surfaces. Especially, in recent years, internal details of atomic and molecular wavefunctions are observed and mapped with negligible disturbance. This is a reference book on the topic.
Notas:This edition also issued in print: 2021.
Descripción Física:1 online resource (lxx, 452 pages) : illustrations
Público:Specialized.
Bibliografía:Includes bibliographical references and index.
ISBN:9780191889905
0191889903
9780192598561
0192598562