Cross-layer reliability of computing systems

This book presents state-of-the-art solutions for increasing the resilience of computing systems, both at single levels of abstraction and multi-layers. It is a valuable resource for researchers, postgraduate students and professional computer architects focusing on the dependability of computing sy...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Otros Autores: Di Natale, Giorgio (Editor ), Gizopoulos, Dimitris (Editor ), Di Carlo, Stefano (Editor ), Bosio, Alberto (Editor ), Canal, Ramon (Editor )
Formato: Electrónico eBook
Idioma:Inglés
Publicado: London The Institution of Engineering and Technology 2020
Colección:Materials, circuits and devices series ; 57.
Temas:
Computer architecture.
Stochastic processes.
Stochastic Processes
Ordinateurs > Architecture.
Processus stochastiques.
Computer architecture
Stochastic processes
computer architecture
fault tolerant computing
instruction sets
multiprocessing systems
stochastic processes
Acceso en línea:Texto completo
Tabla de Contenidos:
  • Technological layer / Antonio Rubio and Ramon Canal
  • Design techniques to improve the resilience of computing systems : logic layer / Lorena Anghel and Michael Nicolaidis
  • Design techniques to improve the resilience of computing systems : architectural layer / Aviral Shrivastava, Kyoungwoo Lee, Hwisoo So, Jinhyo Jung, and Prudhvi Gali
  • Design techniques to improve the resilience of computing systems : software layer / Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Matteo Sonza Reorda, and Josie E. Rodriguez Condia
  • Cross-layer resilience / Eric Cheng and Subhasish Mitra
  • Physical stress / Fernando Fernandes dos Santos, Fabio Benevenuti, Gennaro Rodrigues, Fernanda Kastensmidt, and Paolo Rech
  • Soft error modeling and simulation / Mojtaba Ebrahimi and Mehdi Tahoori
  • Microarchitecture-level reliability assessment of multi-core processors / Athanasios Chatzidimitriou and Dimitris Gizopoulos
  • Fault injection at the instruction set architecture (ISA) level / Karthik Pattabiraman and Guanpeng Li
  • Analytical modeling for crosslayer resiliency / Arijit Biswas
  • Stochastic methods / Alessandro Savino, Alessandro Vallero, and Stefano Di Carlo

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