Cargando…
Characterisation and control of defects in semiconductors /
The following topics are dealt with: semiconductor defect control; semiconductor doping; ion beam effects; ion implantation; elemental semiconductors; silicon; electrically active defects; point defect luminescence; vibrational spectroscopy; magnetic resonance methods; muons; positron annihilation s...
| Clasificación: | Libro Electrónico |
|---|---|
| Otros Autores: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Stevenage :
The Institution of Engineering and Technology,
2019.
|
| Colección: | Materials, circuits and devices series ;
45. |
| Temas: | |
| Acceso en línea: | Texto completo |
| Sumario: | The following topics are dealt with: semiconductor defect control; semiconductor doping; ion beam effects; ion implantation; elemental semiconductors; silicon; electrically active defects; point defect luminescence; vibrational spectroscopy; magnetic resonance methods; muons; positron annihilation spectroscopy; first principles methods; microscopy; 3D atomic-scale studies; ion beam modification; and ion beam analysis and channelling. |
|---|---|
| Descripción Física: | 1 online resource (596 pages) |
| Bibliografía: | Includes bibliographical references and index. |
| ISBN: | 1785616560 9781785616563 |