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Understanding surface scatter phenomena : a linear systems formulation /
"Understanding Surface Scatter Phenomena: A Linear Systems Formulation deals with surface scatter phenomena that continue to be an important issue in diverse areas of science and engineering in the 21st century. Scattering effects from microtopographic surface roughness are merely non paraxial...
| Clasificación: | Libro Electrónico |
|---|---|
| Autor principal: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Bellingham, Washington, USA :
SPIE Press,
[2019]
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| Colección: | SPIE Press monograph ;
PM306. |
| Temas: | |
| Acceso en línea: | Texto completo |
MARC
| LEADER | 00000cam a2200000Mi 4500 | ||
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| 003 | OCoLC | ||
| 005 | 20231027140348.0 | ||
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| 020 | |a 9781510627888 |q (electronic bk.) | ||
| 020 | |z 9781510627871 |q (softcover ; |q alk. paper) | ||
| 020 | |z 1510627871 |q (softcover ; |q alk. paper) | ||
| 020 | |z 9781510627895 |q (ePub) | ||
| 020 | |z 1510627898 |q (ePub) | ||
| 020 | |z 9781510627901 |q (Kindle) | ||
| 020 | |z 1510627901 |q (Kindle) | ||
| 024 | 7 | |a 10.1117/3.2530114 |2 doi | |
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| 035 | |a (OCoLC)1107277055 |z (OCoLC)1287271938 |z (OCoLC)1287875163 | ||
| 050 | 4 | |a QC427.4 |b .H38 2019 | |
| 082 | 0 | 4 | |a 535/.43 |2 23 |
| 049 | |a UAMI | ||
| 100 | 1 | |a Harvey, James E., |e author. | |
| 245 | 1 | 0 | |a Understanding surface scatter phenomena : |b a linear systems formulation / |c James E. Harvey. |
| 264 | 1 | |a Bellingham, Washington, USA : |b SPIE Press, |c [2019] | |
| 264 | 4 | |c ©2019 | |
| 300 | |a 1 online resource (252 pages) | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 490 | 1 | |a SPIE Press monograph ; |v PM306 | |
| 504 | |a Includes bibliographical references and index. | ||
| 505 | 0 | |a Preface -- Acknowledgments -- List of acronyms -- 1. Introduction and overview: 1.1. A linear systems formulation of surface scatter theory; 1.2. Motivation for this book; 1.3. Organization of the book -- 2. Technical background: 2.1. Surface characteristics; 2.2. Specular and diffuse reflectance (total integrated scatter); 2.3. The bidirectional reflectance distribution function (BRDF); 2.4. Vector analysis and direction cosine space; 2.5. Mathematical description of optical wave fields; 2.6. Radiometric quantities and their relationship to complex amplitude -- 3. Historical background of surface scatter theory: 3.1. Rayleigh-Rice surface scatter theory; 3.2. Beckmann-Kirchhoff surface scatter theory; 3.3. The original Harvey-Shack surface scatter theory; 3.4. The modified Harvey-Shack surface scatter theory -- 4. A modified Beckmann-Kirchhoff surface scatter model / James E. Harvey, Andrey Krywonos, and Cynthia L. Vernold: 4.1. Nonintuitive surface scatter measurements; 4.2. Qualitative explanation of nonintuitive surface scatter data; 4.3. Empirical modification of the classical Beckmann-Kirchhoff theory; 4.4. Experimental validation: rough surfaces at large angles; 4.5. Comparison with the Rayleigh-Rice theory for smooth surfaces | |
| 505 | 8 | |a 5. The generalized Harvey-Shack surface scatter theory / Andrey Krywonos, James E. Harvey, and Narak Choi: 5.1. Evolution of the linear systems formulation of surface scatter theory; 5.2. Numerical calculations of scattering behavior for rough surfaces; 5.3. Smooth surface approximation of the generalized Harvey-Shack theory; 5.4. Comparison of the GHS Smooth and the Rayleigh-Rice theories; 5.5. Inherent angular limitation of the Rayleigh-Rice surface scatter theory; 5.6. Predicting BRDFs for arbitrary wavelength and angle of incidence for a moderately rough surface from measured BRDF data at a single wavelength and incident angle; 5.7. Summary -- 6 Numerical validation of the GHS surface scatter theory / Narak Choi and James E. Harvey: 6.1 Surfaces with Gaussian statistics; 6.2 Surfaces with an inverse power law PSD; 6.3 Summary -- 7. Empirical modeling of rough surfaces and subsurface scatter: 7.1. The Helmholtz Reciprocity theorem; 7.2. Example 1: Rough ground glass with oblique incident angles; 7.3. Example 2: Modeling subsurface scatter -- unknown material #1; 7.4. Example 3: Modeling subsurface scatter -- unknown material #2; 7.5. Concluding remarks -- 8. Integrating optical fabrication and metrology into the optical design process / James E. Harvey and Narak Choi: 8.1. Surface scatter in the presence of aberrations; 8.2. A systems engineering analysis of image quality; 8.3. Deriving optical fabrication tolerances to meet image quality requirements -- Index. | |
| 520 | |a "Understanding Surface Scatter Phenomena: A Linear Systems Formulation deals with surface scatter phenomena that continue to be an important issue in diverse areas of science and engineering in the 21st century. Scattering effects from microtopographic surface roughness are merely non paraxial diffraction phenomena. After reviewing the historical background of surface scatter theory, this book describes how integrating sound radiometric principles with scalar diffraction theory results in the development of a linear systems formulation of non paraxial scalar diffraction theory which then becomes the basis of the Generalized Harvey Shack (GHS) surface scatter theory characterized by a two parameter family of surface transfer functions. This GHS surface scatter theory produces accurate results for rougher surfaces than the classical Rayleigh Rice theory and (due to a more general obliquity factor) for larger incident and scattered angles than either the Beckmann-Kirchhoff or Rayleigh-Rice theories. The transfer function characterization of scattering surfaces can be readily incorporated into the traditional linear systems formulation of image formation, thus allowing a systems engineering analysis of image quality as degraded by diffraction effects, geometrical aberrations, surface scatter effects, and a variety of other miscellaneous error sources. This allows us to derive the optical fabrication tolerances necessary to satisfy a specific image quality requirement, which further enables the integration of optical fabrication and metrology into the optical design process."-- |c Provided by publisher. | ||
| 500 | |a Title from PDF title page (SPIE eBooks Website, viewed 2019-06-26). | ||
| 590 | |a Knovel |b ACADEMIC - General Engineering & Project Administration | ||
| 650 | 0 | |a Light |x Scattering. | |
| 650 | 0 | |a Linear systems. | |
| 650 | 0 | |a Optics. | |
| 650 | 6 | |a Lumière |x Diffusion. | |
| 650 | 6 | |a Systèmes linéaires. | |
| 650 | 6 | |a Optique. | |
| 650 | 7 | |a optics. |2 aat | |
| 650 | 7 | |a Light |x Scattering |2 fast | |
| 650 | 7 | |a Linear systems |2 fast | |
| 650 | 7 | |a Optics |2 fast | |
| 710 | 2 | |a Society of Photo-optical Instrumentation Engineers, |e publisher. | |
| 776 | 0 | 8 | |i Print version: |z 1510627871 |z 9781510627871 |w (DLC) 2019006137 |
| 830 | 0 | |a SPIE Press monograph ; |v PM306. | |
| 856 | 4 | 0 | |u https://appknovel.uam.elogim.com/kn/resources/kpUSSALSF2/toc |z Texto completo |
| 938 | |a YBP Library Services |b YANK |n 17220279 | ||
| 938 | |a Society of Photo-Optical Instrumentation Engineers |b SPIE |n 9781510627888 | ||
| 938 | |a EBSCOhost |b EBSC |n 3267685 | ||
| 994 | |a 92 |b IZTAP | ||