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181019s2010 maua ob 001 0 eng d |
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|a HUA
|b eng
|e rda
|e pn
|c HUA
|d OCLCF
|d UWW
|d UAB
|d KNOVL
|d CEF
|d MERER
|d OCLCQ
|d VLB
|d UKAHL
|d OCLCO
|d OCLCQ
|d OCLCO
|d OCLCQ
|d OCLCO
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|a 9781523119271
|q (electronic bk.)
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|a 1523119276
|q (electronic bk.)
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|z 9781596934368
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|a AU@
|b 000066784822
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|a (OCoLC)1057382066
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|a TK7870
|b .B277 2010
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0 |
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|a 621.381
|2 23
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|a UAMI
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|a Băjenescu, Titu I.,
|d 1938-
|e author.
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|a Component reliability for electronic systems /
|c Titu-Marius I. Bajenescu, Marius I. Bazu.
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|a Boston, Mass. ;
|a London :
|b Artech House,
|c 2010.
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264 |
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|c ©2009
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300 |
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|a 1 online resource (xix, 685 pages) :
|b illustrations
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336 |
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|a text
|b txt
|2 rdacontent
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|a computer
|b c
|2 rdamedia
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|a online resource
|b cr
|2 rdacarrier
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|a Includes bibliographical references and index.
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0 |
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|a Introduction -- Reliability building -- Reliability assessment -- Package and reliability -- Failure analysis -- Test and testability -- Reliability of passive electronic parts -- Reliability of diodes -- Silicon power transistor reliability -- Reliability of optoelectronic components -- Reliability of thyristors and triacs -- Reliability of monolithic ICs -- Reliability of memories and microprocessors -- Reliability of hybrid ICs -- Reliability of micro- and nanosystems.
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|a "The main reason for the premature breakdown of today s electronic products (computers, cars, tools, appliances, etc.) is the failure of the components used to build these products. To help ensure longer-lasting, more technically sound products and systems, a solid understanding of effective ways to minimize the degradation is essential." "This practical book offers you specific guidance on how to design more reliable components and build more reliable electronic systems. You learn how to optimize a virtual component prototype, accurately monitor product reliability during the entire production process, and add the burn-in and selection procedures that are the most appropriate for your applications. Moreover, the book helps you ensure that all components are correctly applied, margins are adequate, wear-out failure modes are prevented during the expected duration of life, and system interfaces cannot lead to failure."--Jacket
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|a Print version record.
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590 |
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|a Knovel
|b ACADEMIC - Electronics & Semiconductors
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590 |
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|a Knovel
|b ACADEMIC - Aerospace & Radar Technology
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650 |
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|a Electronic systems
|x Testing.
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650 |
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|a Reliability (Engineering)
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650 |
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|a Component software
|x Reliability.
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650 |
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|a Software architecture
|x Reliability.
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650 |
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6 |
|a Fiabilité.
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650 |
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6 |
|a Composants logiciels
|x Fiabilité.
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650 |
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6 |
|a Architecture logicielle
|x Fiabilité.
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650 |
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7 |
|a Electronic systems
|x Testing
|2 fast
|
650 |
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7 |
|a Reliability (Engineering)
|2 fast
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700 |
1 |
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|a Bâzu, M. I.
|q (Marius I.),
|d 1948-
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776 |
0 |
8 |
|i Print version:
|a Băjenescu, Titu I., 1938-
|t Component reliability for electronic systems.
|d Boston, Mass. ; London : Artech House, 2010
|z 9781596934368
|w (OCoLC)477251747
|
856 |
4 |
0 |
|u https://appknovel.uam.elogim.com/kn/resources/kpCRES0001/toc
|z Texto completo
|
938 |
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|a Askews and Holts Library Services
|b ASKH
|n AH29359746
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994 |
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|a 92
|b IZTAP
|