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Component reliability for electronic systems /

"The main reason for the premature breakdown of today s electronic products (computers, cars, tools, appliances, etc.) is the failure of the components used to build these products. To help ensure longer-lasting, more technically sound products and systems, a solid understanding of effective wa...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Băjenescu, Titu I., 1938- (Autor)
Otros Autores: Bâzu, M. I. (Marius I.), 1948-
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Boston, Mass. ; London : Artech House, 2010.
Temas:
Acceso en línea:Texto completo

MARC

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007 cr |||||||||||
008 181019s2010 maua ob 001 0 eng d
040 |a HUA  |b eng  |e rda  |e pn  |c HUA  |d OCLCF  |d UWW  |d UAB  |d KNOVL  |d CEF  |d MERER  |d OCLCQ  |d VLB  |d UKAHL  |d OCLCO  |d OCLCQ  |d OCLCO  |d OCLCQ  |d OCLCO 
020 |a 9781523119271  |q (electronic bk.) 
020 |a 1523119276  |q (electronic bk.) 
020 |z 9781596934368 
029 1 |a AU@  |b 000066784822 
035 |a (OCoLC)1057382066 
050 4 |a TK7870  |b .B277 2010 
082 0 4 |a 621.381  |2 23 
049 |a UAMI 
100 1 |a Băjenescu, Titu I.,  |d 1938-  |e author. 
245 1 0 |a Component reliability for electronic systems /  |c Titu-Marius I. Bajenescu, Marius I. Bazu. 
264 1 |a Boston, Mass. ;  |a London :  |b Artech House,  |c 2010. 
264 4 |c ©2009 
300 |a 1 online resource (xix, 685 pages) :  |b illustrations 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
504 |a Includes bibliographical references and index. 
505 0 |a Introduction -- Reliability building -- Reliability assessment -- Package and reliability -- Failure analysis -- Test and testability -- Reliability of passive electronic parts -- Reliability of diodes -- Silicon power transistor reliability -- Reliability of optoelectronic components -- Reliability of thyristors and triacs -- Reliability of monolithic ICs -- Reliability of memories and microprocessors -- Reliability of hybrid ICs -- Reliability of micro- and nanosystems. 
520 1 |a "The main reason for the premature breakdown of today s electronic products (computers, cars, tools, appliances, etc.) is the failure of the components used to build these products. To help ensure longer-lasting, more technically sound products and systems, a solid understanding of effective ways to minimize the degradation is essential." "This practical book offers you specific guidance on how to design more reliable components and build more reliable electronic systems. You learn how to optimize a virtual component prototype, accurately monitor product reliability during the entire production process, and add the burn-in and selection procedures that are the most appropriate for your applications. Moreover, the book helps you ensure that all components are correctly applied, margins are adequate, wear-out failure modes are prevented during the expected duration of life, and system interfaces cannot lead to failure."--Jacket 
588 0 |a Print version record. 
590 |a Knovel  |b ACADEMIC - Electronics & Semiconductors 
590 |a Knovel  |b ACADEMIC - Aerospace & Radar Technology 
650 0 |a Electronic systems  |x Testing. 
650 0 |a Reliability (Engineering) 
650 0 |a Component software  |x Reliability. 
650 0 |a Software architecture  |x Reliability. 
650 6 |a Fiabilité. 
650 6 |a Composants logiciels  |x Fiabilité. 
650 6 |a Architecture logicielle  |x Fiabilité. 
650 7 |a Electronic systems  |x Testing  |2 fast 
650 7 |a Reliability (Engineering)  |2 fast 
700 1 |a Bâzu, M. I.  |q (Marius I.),  |d 1948- 
776 0 8 |i Print version:  |a Băjenescu, Titu I., 1938-  |t Component reliability for electronic systems.  |d Boston, Mass. ; London : Artech House, 2010  |z 9781596934368  |w (OCoLC)477251747 
856 4 0 |u https://appknovel.uam.elogim.com/kn/resources/kpCRES0001/toc  |z Texto completo 
938 |a Askews and Holts Library Services  |b ASKH  |n AH29359746 
994 |a 92  |b IZTAP