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Optical physics for nanolithography /

This book provides an in-depth, self-contained introduction of partially coherent imaging theory for researchers and engineers working on optical lithography for semiconductor manufacturing, including those in the EDA industry. It is mathematically complete: the opening chapters discuss the essentia...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores principales: Yen, Anthony (Autor), Yu, Shinn-Sheng (Autor)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Bellingham, Washington (1000 20th St. Bellingham WA 98225-6705 USA) : SPIE, 2018.
Colección:SPIE Press monograph ; PM284.
Temas:
Acceso en línea:Texto completo

MARC

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100 1 |a Yen, Anthony,  |e author. 
245 1 0 |a Optical physics for nanolithography /  |c Anthony Yen, Shinn-Sheng Yu. 
264 1 |a Bellingham, Washington (1000 20th St. Bellingham WA 98225-6705 USA) :  |b SPIE,  |c 2018. 
300 |a 1 online resource (352 pages) :  |b color illustrations 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
490 1 |a SPIE Press monograph ;  |v PM284 
504 |a Includes bibliographical references and index. 
505 0 |a Preface -- Notations and conventions -- 1. Mathematical preliminaries: 1.1. Mean-value theorems of integral calculus; 1.2. The delta function; 1.3. Weierstrass' approximation theorem; 1.4. Fourier transform; 1.5. Vector algebra; 1.6. Vector calculus; 1.7. Curvilinear coordinates; 1.8. Solution to Poisson's equation; 1.9. Helmholtz's theorem -- 2. Electromagnetic waves in free space: 2.1. Maxwell's equations in free space; 2.2. Electromagnetic radiation; 2.3. Systematic solution of inhomogeneous wave equations with boundary and initial conditions; 2.4. Solution inhomogeneous wave equations with harmonic time dependence -- 3. Electromagnetic waves in material media: 3.1. Macroscopic fields in material media; 3.2. Energy in electromagnetic fields; 3.3. Hertz vectors; 3.4. Fields of an electric dipole; 3.5. Dielectric properties of matter; 3.6. Physical origin of reflection and transmission; Ewald-Oseen extinction theorem; 3.7. Reflection and transmission upon incidence on a multilayer stack -- 4. Elements of geometrical optics: 4.1. Geometrical wavefronts and light rays; 4.2. Fermat's principle; 4.3. The characteristic functions of Hamilton; 4.4. The sine condition; 4.5. The Herschel condition; 4.6. The paraxial approximation; 4.7. The Smith-Helmholtz invariant; 4.8. The thin lens formula; 4.9. Stops, pupils, and windows; 4.10. Chief and marginal rays; meridional, tangential, and sagittal planes; meridional and skew rays. 
505 8 |a 5. Diffraction of electromagnetic waves: 5.1. The scalar theory of diffraction; 5.2. Fresnel and Fraunhofer approximations; 5.3. Representation of the diffracted field by the angular spectrum of plane waves; 5.4. The vector theory of diffraction -- 6. Image formation in an optical system: 6.1. Heuristic imaging theory; 6.2. The lithographic imaging system; 6.3. Imaging by a point source: coherent imaging; 6.4. Imaging by an extended source: partially coherent imaging; 6.5. Yamazoe's stacked shifted pupil formulation; 6.6. Imaging with a higher numerical aperture: radiometric correction; 6.7. 3-D point spread function; 6.8. Imaging with a higher numerical aperture: polarization effect -- 7. Aberrations in optical imaging systems: 7.1. Design of aspherical surfaces; 7.2. Connection between ray and wave aberrations; 7.3. The wave aberration for rotationally symmetric optical systems: Seidel aberrations; 7.4. General form of the aberration function for rotationally symmetric optical systems; 7.5. Digression: Gram-Schmidt orthogonalization process and orthogonal polynomials; 7.6. Orthogonal polynomials for expanding the aberration function: Zernike polynomials -- Index. 
520 |a This book provides an in-depth, self-contained introduction of partially coherent imaging theory for researchers and engineers working on optical lithography for semiconductor manufacturing, including those in the EDA industry. It is mathematically complete: the opening chapters discuss the essential principles, and all derivations are presented with their intermediate steps. For increased accessibility, simplified and consistent notations are used throughout the text. Full-color pages illustrate the connections between figures and equations. 
590 |a Knovel  |b ACADEMIC - Optics & Photonics 
590 |a Knovel  |b ACADEMIC - Chemistry & Chemical Engineering 
650 0 |a Optics. 
650 0 |a Imaging systems. 
650 0 |a Nanolithography. 
650 6 |a Optique. 
650 6 |a Imagerie (Technique) 
650 6 |a Nanolithographie. 
650 7 |a optics.  |2 aat 
650 7 |a Imaging systems.  |2 fast  |0 (OCoLC)fst00967605 
650 7 |a Nanolithography.  |2 fast  |0 (OCoLC)fst01894717 
650 7 |a Optics.  |2 fast  |0 (OCoLC)fst01046845 
700 1 |a Yu, Shinn-Sheng,  |e author. 
710 2 |a Society of Photo-optical Instrumentation Engineers,  |e publisher. 
776 0 8 |i Print version:  |z 151061737X  |z 9781510617377  |w (DLC) 2018930737 
830 0 |a SPIE Press monograph ;  |v PM284. 
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938 |a YBP Library Services  |b YANK  |n 15357756 
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994 |a 92  |b IZTAP