ISTFA 2016 : conference proceedings from the 42nd International Symposium for Testing and Failure Analysis ; November 6-10, 2016, Fort Worth Convention Center, Fort Worth, Texas, USA /

Detalles Bibliográficos
Autor Corporativo: International Symposium for Testing and Failure Analysis Houston, Tex.
Formato: Congresos, conferencias eBook
Idioma:Inglés
Publicado: Materials Park, Ohio : ASM International, 2016.
Temas:
Electronics > Materials > Testing > Congresses.
Electronic apparatus and appliances > Testing > Congresses.
Appareils électroniques > Essais > Congrès.
Electronic apparatus and appliances > Testing.
Electronics > Materials > Testing.
Conference papers and proceedings.
Acceso en línea:Texto completo

MARC

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020 |a 9781627081368  |q (e-book) 
020 |a 1627081364  |q (e-book) 
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049 |a UAMI 
111 2 |a International Symposium for Testing and Failure Analysis  |n (42nd :  |d 2016 :  |c Houston, Tex.) 
245 1 0 |a ISTFA 2016 :  |b conference proceedings from the 42nd International Symposium for Testing and Failure Analysis ; November 6-10, 2016, Fort Worth Convention Center, Fort Worth, Texas, USA /  |c organized by Electronic Device Failure Analysis Society, ISTFA/16, ASM International. 
264 1 |a Materials Park, Ohio :  |b ASM International,  |c 2016. 
264 4 |c ©2016 
300 |a 1 online resource (xviii, 641 pages :) :  |b illustrations, photographs 
336 |a text  |b txt  |2 rdacontent 
336 |a still image  |b sti  |2 rdacontent 
337 |a unmediated  |b n  |2 rdamedia 
338 |a volume  |b nc  |2 rdacarrier 
500 |a Includes author index. 
590 |a Knovel  |b ACADEMIC - Nondestructive Testing & Evaluation 
650 0 |a Electronics  |x Materials  |x Testing  |v Congresses. 
650 0 |a Electronic apparatus and appliances  |x Testing  |v Congresses. 
650 6 |a Appareils électroniques  |x Essais  |v Congrès. 
650 7 |a Electronic apparatus and appliances  |x Testing.  |2 fast  |0 (OCoLC)fst00906837 
650 7 |a Electronics  |x Materials  |x Testing.  |2 fast  |0 (OCoLC)fst00907571 
655 7 |a Conference papers and proceedings.  |2 fast  |0 (OCoLC)fst01423772 
710 2 |a Electronic Device Failure Analysis Society,  |e organizer. 
710 2 |a ASM International,  |e organizer. 
856 4 0 |u https://appknovel.uam.elogim.com/kn/resources/kpISTFAC56/toc  |z Texto completo 
994 |a 92  |b IZTAP 

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