Cargando…
Structure analysis of advanced nanomaterials : nanoworld by high-resolution electron microscopy /
<!Doctype html public ""-//w3c//dtd html 4.0 transitional//en""> <html><head> <meta http-equiv=content-type content=""text/html; charset=iso-8859-1""> <meta content=""mshtml 6.00.6000.17110"" name=generator><...
| Clasificación: | Libro Electrónico |
|---|---|
| Autor principal: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Berlin ; Boston :
De Gruyter,
[2014]
|
| Temas: | |
| Acceso en línea: | Texto completo |
Tabla de Contenidos:
- Preface; Contents; Table for physical constants; 1 Introduction; 1.1 Characteristic of electron microscopy; 1.2 What information can be obtained by electron microscopy?; 1.3 Various types of electron microscopy; 2 Structure and principle of electron microscopes; 2.1 Structure of transmission electron microscope; 2.2 Observation mechanism of atoms by electrons; 2.3 Information from electron diffraction pattern; 2.4 High-resolution electron microscopy; 2.5 Scanning electron microscope; 2.6 Electron energy-loss spectroscopy; 2.7 Energy dispersive X-ray spectroscopy.
- 2.8 High-angle annular dark-field scanning TEM2.9 Electron holography and Lorentz microscopy; 2.10 Image simulation; 3 Practice of HREM; 3.1 Sample preparation; 3.2 Specimen preparation methods; 3.3 Structure analysis by X-ray diffraction; 3.4 TEM observation; 3.5 HREM observation; 3.6 Fourier filtering; 3.7 Resolution of HREM images; 3.8 Prevention of damage and contamination; 3.9 Taking images and reading data; 3.10 Mental attitude for TEM; 4 Characterization by HREM; 4.1 What information can be obtained?; 4.2 Direct atomic observation; 4.3 Crystallographic image processing.