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Diagnostic testing and life estimation of power equipment /

Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Ramu, T. S.
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Tunbridge Wells [England] : New Academic Science, ©2012.
Temas:
Acceso en línea:Texto completo
Tabla de Contenidos:
  • Cover
  • Preface
  • Contents
  • Introduction
  • Chapter 1 Dielectric Behaviour in Electric and Thermal Fields
  • 1.1 Introduction
  • 1.2 Mechanism of Electrical Conduction in Matter
  • 1.2.1 Conduction in Metals
  • 1.2.2 Conduction in Dielectrics
  • 1.3 Charge Storage in Dielectrics
  • 1.3.1 Electric Field between Charged Conducting Planes
  • 1.3.2 The Concept of Permittivity
  • 1.3.3 The Electric Dipole
  • 1.3.4 Structure of Dielectrics
  • 1.3.5 A Rigid Dipole in a Uniform External Field
  • 1.3.6 Energy in an Electrostatic Field
  • 1.3.7 Interfacial Polarisation1.4 Non-Ideal Dielectrics
  • 1.5 Behaviour of Dielectric in Time Varying Fields
  • 1.5.1 The Concept of Complex Permittivity
  • 1.5.2 Frequency and Temperature Response of Dielectrics
  • 1.5.2.1 Frequency Response
  • 1.5.2.2 The Temperature Response
  • 1.5.3 Equivalent Circuits
  • 1.5.3.1 Equivalence of Parallel and Series Representations
  • 1.6 Conduction in Dielectrics
  • 1.6.1 The Volume Conductivity
  • 1.6.2 Surface Conductivity
  • 1.7 Breakdown in Dielectrics
  • 1.7.1 Breakdown Mechanisms in Gases
  • 1.7.1.1 Electronegative Gases1.7.1.2 Paschenâ€?s Law
  • 1.7.2 Conduction and Breakdown in Liquids
  • 1.7.3 Breakdown Mechanisms in Solids
  • 1.7.3.1 Surface Breakdown
  • 1.7.3.2 Tracking in Solid Electrical Insulation
  • 1.7.3.3 Intrinsic Breakdown
  • 1.7.3.4 Breakdown in Commercial Dielectrics
  • 1.7.3.5 Breakdown due to Treeing
  • 1.7.4 Corona and Partial Discharges
  • 1.7.4.1 Corona Discharges
  • 1.7.4.2 Partial Discharges
  • 1.7.5 Thermal Breakdown
  • 1.7.5.1 The Steady-state Thermal Breakdown
  • 1.7.6 General Theory of Thermal Breakdown in Solids
  • 1.7.6.1 Thermal Breakdown in â€?Thinâ€? SpecimensChapter 2 Measurement of Dielectric Parameters
  • 2.1 General
  • 2.2 Permittivity and tanÎ?
  • 2.3 Volume and Surface Conductivity
  • 2.4 Partial Discharge Measurements
  • 2.5 Calibration of PD Measuring Circuits and Detector
  • 2.6 Measurement of Dielectric Strength
  • Chapter 3 Models for Electrical Insulation Failure
  • 3.1 General
  • 3.2 Physical Models for Insulation Failure
  • 3.3 Single Stress Modelling
  • 3.3.1 Model for Ageing under Electrical Stress
  • 3.3.2 Thermal Stress Model
  • 3.3.3 Modelling of Mechanical Stress3.4 Multifactor Models
  • 3.4.1 Sequential Stress
  • 3.4.2 Combined Stress Models
  • 3.4.2.1 The Case of E + T
  • 3.4.2.2 The Case of E +M
  • 3.4.2.3 The Case of T + M
  • 3.4.2.4 The Case of T + E + M
  • Chapter 4 Stochastic Nature of Electrical Insulation Failure
  • 4.1 General
  • 4.1.1 The Concept of a Random Variable (RV)
  • 4.1.2 Conditional Probability
  • 4.1.3 The Hazard Function
  • 4.1.4 Probabilistic Aspects of Insulation Ageing
  • 4.2 Statistical Aspects of Thermal Ageing