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An introduction to mixed-signal IC test and measurement /
"With the proliferation of complex semiconductor devices containing digital, analog, mixed-signal and radio-frequency circuits, the economics of test has come to the forefront and today's engineer needs to be fluent in all four circuit types. Having access to a book that covers these topic...
| Clasificación: | Libro Electrónico |
|---|---|
| Autor principal: | |
| Otros Autores: | , |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
New York :
Oxford University Press,
©2012.
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| Edición: | 2nd ed. |
| Colección: | Oxford series in electrical and computer engineering.
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| Temas: | |
| Acceso en línea: | Texto completo |
Tabla de Contenidos:
- Overview of mixed-signal testing
- Tester hardware
- DC and parametric measurements
- Data analysis and probability theory
- Yield, measurement accuracy, and test time
- DAC testing
- ADC testing
- Sampling theory
- DSP-based testing
- Analog channel testing
- Sampled channel testing
- Fundamentals of RF testing
- RF test methods
- Clock and serial data communications channel measurements
- Tester interfacing--DIB design
- Design for test (DfT).