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An introduction to mixed-signal IC test and measurement /
"With the proliferation of complex semiconductor devices containing digital, analog, mixed-signal and radio-frequency circuits, the economics of test has come to the forefront and today's engineer needs to be fluent in all four circuit types. Having access to a book that covers these topic...
| Clasificación: | Libro Electrónico |
|---|---|
| Autor principal: | |
| Otros Autores: | , |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
New York :
Oxford University Press,
©2012.
|
| Edición: | 2nd ed. |
| Colección: | Oxford series in electrical and computer engineering.
|
| Temas: | |
| Acceso en línea: | Texto completo |
MARC
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| 008 | 120801s2012 nyua ob 001 0 eng d | ||
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| 082 | 0 | 4 | |a 621.3815 |2 23 |
| 049 | |a UAMI | ||
| 100 | 1 | |a Roberts, Gordon W., |d 1959- | |
| 245 | 1 | 3 | |a An introduction to mixed-signal IC test and measurement / |c Gordon Roberts, Friedrich Taenzler, Mark Burns. |
| 250 | |a 2nd ed. | ||
| 260 | |a New York : |b Oxford University Press, |c ©2012. | ||
| 300 | |a 1 online resource (xxv, 836 pages) : |b illustrations | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 490 | 1 | |a The Oxford series in electrical and computer engineering | |
| 500 | |a Burns' name appears first on the previous edition. | ||
| 504 | |a Includes bibliographical references and index. | ||
| 505 | 0 | |a Overview of mixed-signal testing -- Tester hardware -- DC and parametric measurements -- Data analysis and probability theory -- Yield, measurement accuracy, and test time -- DAC testing -- ADC testing -- Sampling theory -- DSP-based testing -- Analog channel testing -- Sampled channel testing -- Fundamentals of RF testing -- RF test methods -- Clock and serial data communications channel measurements -- Tester interfacing--DIB design -- Design for test (DfT). | |
| 520 | |a "With the proliferation of complex semiconductor devices containing digital, analog, mixed-signal and radio-frequency circuits, the economics of test has come to the forefront and today's engineer needs to be fluent in all four circuit types. Having access to a book that covers these topics will help the evolving test engineer immensely and will be an invaluable resource. In addition, the second edition includes lengthy discussion on RF circuits, high-speed I/Os and probabilistic reasoning. Appropriate for the junior/senior university level, this textbook includes hundreds of examples, exercises and problems"--Provided by publisher | ||
| 588 | 0 | |a Print version record. | |
| 590 | |a Knovel |b ACADEMIC - Electronics & Semiconductors | ||
| 590 | |a Knovel |b ACADEMIC - Computer Hardware Engineering | ||
| 650 | 0 | |a Integrated circuits |x Testing. | |
| 650 | 0 | |a Mixed signal circuits |x Testing. | |
| 650 | 7 | |a Integrated circuits |x Testing. |2 fast |0 (OCoLC)fst00975593 | |
| 650 | 7 | |a Mixed signal circuits |x Testing. |2 fast |0 (OCoLC)fst01024108 | |
| 700 | 1 | |a Taenzler, Friedrich. | |
| 700 | 1 | |a Burns, Mark, |d 1962- | |
| 776 | 0 | 8 | |i Print version: |a Roberts, Gordon W., 1959- |t Introduction to mixed-signal IC test and measurement. |b 2nd ed. |d New York : Oxford University Press, ©2012 |z 9780199796212 |w (DLC) 2011031312 |w (OCoLC)774691433 |
| 830 | 0 | |a Oxford series in electrical and computer engineering. | |
| 856 | 4 | 0 | |u https://appknovel.uam.elogim.com/kn/resources/kpIMSICTM4/toc |z Texto completo |
| 994 | |a 92 |b IZTAP | ||