Cargando…
An introduction to mixed-signal IC test and measurement /
"With the proliferation of complex semiconductor devices containing digital, analog, mixed-signal and radio-frequency circuits, the economics of test has come to the forefront and today's engineer needs to be fluent in all four circuit types. Having access to a book that covers these topic...
| Clasificación: | Libro Electrónico |
|---|---|
| Autor principal: | |
| Otros Autores: | , |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
New York :
Oxford University Press,
©2012.
|
| Edición: | 2nd ed. |
| Colección: | Oxford series in electrical and computer engineering.
|
| Temas: | |
| Acceso en línea: | Texto completo |
| Sumario: | "With the proliferation of complex semiconductor devices containing digital, analog, mixed-signal and radio-frequency circuits, the economics of test has come to the forefront and today's engineer needs to be fluent in all four circuit types. Having access to a book that covers these topics will help the evolving test engineer immensely and will be an invaluable resource. In addition, the second edition includes lengthy discussion on RF circuits, high-speed I/Os and probabilistic reasoning. Appropriate for the junior/senior university level, this textbook includes hundreds of examples, exercises and problems"--Provided by publisher |
|---|---|
| Notas: | Burns' name appears first on the previous edition. |
| Descripción Física: | 1 online resource (xxv, 836 pages) : illustrations |
| Bibliografía: | Includes bibliographical references and index. |
| ISBN: | 9781613449486 1613449488 |