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Coaxial electrical circuits for interference-free measurements /

Annotation

Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Awan, Shakil, 1971-
Otros Autores: Schurr, Jürgen, 1962-, Kibble, B. P.
Formato: Electrónico eBook
Idioma:Inglés
Publicado: London : Institution of Engineering and Technology, 2011.
Colección:IET electrical measurement series ; 13.
Temas:
Acceso en línea:Texto completo
Tabla de Contenidos:
  • Machine generated contents note: 1.1. Interactions between circuits[-]eliminating electrical interference
  • 1.1.1. Basic principles
  • 1.1.2. An illustrative example[-]using a phase-sensitive detector
  • 1.1.3. Diagnostic equipment
  • 1.1.4. Isolation
  • 1.1.5. Totally isolating transformers and power supplies
  • 1.1.6. Isolating a noisy instrument
  • 1.1.7. The available methods for isolating outputs
  • 1.1.8. Balancing
  • 1.1.9. Minimising the effects of insufficiently isolated commercial instruments
  • 1.1.10. The 'traditional' approach to DC and low-frequency circuitry versus the current-balanced conductor-pair coaxial approach
  • 1.1.11. Thermoelectric emfs
  • 1.1.12. Designing temperature-controlled enclosures
  • 1.1.13. Ionising radiation (cosmic rays, etc.)
  • 1.1.14. Final remarks
  • References
  • 2.1. General principles
  • 2.1.1. The output impedance of a network affects detector sensitivity
  • 2.1.2. The sensitivity of detectors to harmonic content
  • Note continued: 2.1.3. Noise and noise matching a detector to a network
  • 2.1.4. The concept of a noise figure
  • 2.2. Attributes of sources
  • 2.3. Properties of different detectors
  • 2.3.1. Preamplifiers
  • 2.3.2. Wideband (untuned) detectors
  • 2.3.3. Narrowband (tuned) detectors
  • 2.3.4. Phase-sensitive detectors that employ a switching technique
  • 2.3.5. Phase-sensitive detectors employing a modulating technique
  • 2.4. Cables and connectors
  • References
  • 3.1. The coaxial conductor
  • 3.1.1. Achieving current equalisation
  • 3.1.2. The concept of a coaxial network
  • 3.2. Construction and properties of coaxial networks
  • 3.2.1. Equalisers in bridge or other measuring networks
  • 3.2.2. Assessing the efficiency of current equalisers
  • 3.2.3. Single conductors added to an equalised network
  • 3.2.4. Other conductor systems having similar properties
  • 3.2.5. DC networks
  • 3.2.6. The effect of a length of cable on a measured value
  • 3.2.7. Tri-axial cable
  • References
  • Note continued: 4.1. Improvements in defining what is to be observed or measured
  • 4.1.1. Ratio devices
  • 4.1.2. Impedance standards
  • 4.1.3. Formal representation of circuit diagrams and components
  • 5.1. The evolution of a coaxial bridge
  • 5.1.1.A simple coaxial bridge as an example of a coaxial network
  • 5.2. The validity of lumped component representations
  • 5.3. General principles applying to all impedance standards
  • 5.3.1. The physical definition of a standard
  • 5.3.2. The electrical definition of a standard impedance
  • 5.3.3. Two-terminal definition
  • 5.3.4. Four-terminal definition
  • 5.3.5. Four-terminal coaxial definition
  • 5.3.6. Two-terminal-pair definition
  • 5.3.7. Three-terminal definition
  • 5.3.8. Four-terminal-pair definition
  • 5.3.9. Measuring four-terminal-pair admittances in a two-terminal-pair bridge by extrapolation
  • 5.3.10. Adaptors to convert a two- or four-terminal definition to a four-terminal-pair definition
  • Note continued: 5.4. The effect of cables connected to the ports of impedance standards
  • 5.4.1. The effect of cables on a two-terminal component
  • 5.4.2. The effect of cables on a four-terminal coaxial component
  • 5.4.3. The effect of cables on a two-terminal-pair component
  • 5.4.4. The effect of cables on a four-terminal-pair component
  • 5.5. An analysis of conductor-pair bridges to show how the effect of shunt admittances can be eliminated
  • 5.5.1.Comparing direct admittances using voltage sources
  • 5.6.Combining networks to eliminate the effect of unwanted potential differences
  • 5.6.1. The concept of a combining network
  • 5.6.2.A general purpose AC combining network and current source
  • 5.7. Connecting two-terminal-pair impedances in parallel
  • References
  • 6.1. The history of impedance standards
  • 6.2. The Thompson[-]Lampard theorem
  • 6.3. Primary standards of phase angle
  • 6.4. Impedance components in general
  • 6.4.1. Capacitors
  • Note continued: 6.4.2. Parallel-plate capacitance standard
  • 6.4.3. Two-terminal capacitors
  • 6.4.4. Three-terminal capacitors
  • 6.4.5. Two- and four-terminal-pair capacitors
  • 6.4.6. The mechanical construction and properties of various types of capacitors
  • 6.4.7. Capacitance standards of greater than 1 [æ]F
  • 6.4.8. Voltage dependence of capacitors
  • 6.4.9. Resistors
  • 6.4.10.T-networks
  • 6.4.11. Adding auxiliary components to resistors to reduce their reactive component
  • 6.4.12. Mutual inductors: Campbell's calculable mutual inductance standard
  • 6.4.13. Self-inductors
  • 6.5. Resistors, capacitors and inductors of calculable frequency dependence
  • 6.5.1. Resistance standards
  • 6.5.2. Haddad coaxial resistance standard
  • 6.5.3.A nearly ideal HF calculable coaxial resistance standard
  • 6.5.4.A bifilar resistance standard
  • 6.5.5. Gibbings quadrifilar resistance standard
  • 6.5.6. Bohácek and Wood octofilar resistance standard
  • Note continued: 6.5.7. HF secondary resistance standards
  • 6.5.8. HF parallel-plate capacitance standard
  • 6.5.9. HF calculable coaxial capacitance standard
  • 6.5.10. HF calculable coaxial inductance standard
  • 6.5.11.A frequency-independent standard of impedance
  • 6.5.12. An ideal standard of impedance of calculable frequency dependence
  • 6.6. Quantum Hall resistance
  • 6.6.1. Properties of the quantum Hall effect (QHE) and its use as a DC resistance standard
  • 6.6.2. The properties and the equivalent circuit of a quantum Hall device
  • 6.6.3. Device handling
  • 6.7. QHE measured with AC
  • 6.7.1. Multiple-series connection scheme
  • 6.7.2.A device holder and coaxial leads
  • 6.7.3. Active equalisers
  • 6.7.4. Capacitive model of ungated and split-gated quantum Hall devices
  • 6.7.5. Ungated quantum Hall devices
  • 6.7.6. Split-gated quantum Hall devices
  • 6.7.7. Double-shielded device
  • References
  • 7.1. General considerations
  • Note continued: 7.1.1. The causes of departure from an ideal transformer
  • 7.1.2. The magnetic core
  • 7.1.3. The windings; the effect of leakage inductances, capacitances and resistances
  • 7.1.4. Representation of a non-ideal transformer: the effect of loading on its ratio windings
  • 7.1.5. The two-stage principle
  • 7.1.6. Electrical screens between windings
  • 7.2. Constructional techniques
  • 7.2.1. Design of transformer windings
  • 7.2.2. Techniques for minimising the effect of leakage inductance, winding resistance and the capacitances of ratio windings
  • 7.2.3. Bifilar winding
  • 7.2.4. Rope winding having randomly arranged strands
  • 7.2.5. Ordered rope winding
  • 7.2.6. Magnetic and electric screens
  • 7.2.7. Testing the attainment of a nearly toroidal field
  • 7.2.8. Connections to the output ports
  • 7.3. Types of transformers
  • 7.3.1. Inductive voltage dividers
  • 7.3.2. Two-staged IVDs
  • 7.3.3. Injection and detection transformers
  • Note continued: 7.3.4. Use of an injection transformer as a small voltage source
  • 7.3.5. Use of an injection transformer as a detector of zero current
  • 7.3.6. Calibration of injection transformers and their associated phase change circuits
  • 7.3.7. Voltage ratio transformers
  • 7.3.8. Two-stage construction
  • 7.3.9. Matching transformers
  • 7.3.10. Current ratio transformers
  • 7.3.11. High-frequency construction
  • 7.4. Calibration of transformers
  • 7.4.1. Calibrating an IVD in terms of a fixed-ratio transformer
  • 7.4.2. Calibrating voltage ratio transformers using a calibration transformer with a single output voltage
  • 7.4.3. Calibration with a 1:-1 ratio transformer
  • 7.4.4. The bridge circuit and details of the shielding
  • 7.4.5. The balancing procedure
  • 7.4.6. Calibrating voltage transformers by permuting capacitors in a bridge
  • 7.4.7. Calibration of current transformers
  • 7.4.8. Assessing the effectiveness of current equalisers
  • References
  • Note continued: 8.1. Designing bridge networks
  • 8.1.1. Applying coaxial techniques to classical single-conductor bridges
  • 8.1.2. Placement of current equalisers
  • 8.1.3. Wagner circuit (and when it is applicable)
  • 8.1.4. Convergence
  • 8.1.5. Moving a detector to other ports in a bridge network
  • 8.1.6.T-connecting shunt impedances for balance adjustment
  • 8.1.7. Role of electronics in bridge design
  • 8.1.8. Automating bridge networks
  • 8.1.9. Higher-frequency networks
  • 8.1.10. Tests of the accuracy of bridges
  • References
  • 9.1. Bridges to measure the ratio of like impedances
  • 9.1.1.A two-terminal IVD bridge
  • 9.1.2.A two-terminal-pair IVD bridge
  • 9.1.3.A four-terminal-pair IVD bridge
  • 9.1.4.A two-terminal-pair bridge based on a 10:-1 voltage ratio transformer
  • 9.1.5.A four-terminal-pair bridge based on a two-stage 10:-1 voltage ratio transformer
  • 9.1.6. Equal-power resistance bridge
  • 9.2. Bridges to measure the ratio of unlike impedances
  • Note continued: 9.2.1.R-C: the quadrature bridge
  • 9.2.2. The quadrature bridge-a two-terminal-pair design
  • 9.2.3. The quadrature bridge-a four-terminal-pair design
  • 9.2.4. Bridges for measuring inductance
  • 9.3. AC measurement of quantum Hall resistance
  • 9.3.1. AC contact resistance
  • 9.3.2. AC longitudinal resistance
  • 9.3.3. Measuring RxxLo
  • 9.3.4. Measuring RxxHi
  • 9.3.5.A simple coaxial bridge for measuring non-decade capacitances
  • 9.3.6. Coaxial resistance ratio bridges involving quantum Hall devices
  • 9.3.7.A quadrature bridge with two quantum Hall devices
  • 9.4. High-frequency networks
  • 9.4.1. An IVD-based bridge for comparing 10:1 ratios of impedance from 10 kHz to 1 MHz
  • 9.4.2.A bridge for measuring impedance from 10 kHz to 1 MHz based on a 10:-1 voltage ratio transformer
  • 9.4.3. Quasi-four-terminal-pair 1:1 and 10:1 ratio bridges for comparing similar impedances from 0.5 to 10 MHz
  • 9.4.4.A four-terminal-pair 10-MHz 1:1 resistance ratio bridge
  • Note continued: 9.4.5.A 1.6- and 16-MHz quadrature bridge
  • 9.4.6. Four-terminal-pair resonance frequency measurement of capacitors
  • 9.4.7. Scattering parameter measurements and the link to microwave measurements
  • 9.4.8. Electronic four-terminal-pair impedance-measuring instruments
  • References
  • 10.1. Resistance thermometry (DC and low-frequency AC)
  • 10.1.1. DC resistance thermometry
  • 10.1.2. AC resistance thermometry
  • 10.2. Superconducting cryogenic current comparator
  • 10.2.1. Determining the DC ratio of two resistances R1/R2
  • 10.3. Josephson voltage sources and accurate voltage measurement
  • 10.4. Future directions
  • 10.4.1. Higher-frequency measurements of quantum Hall resistance
  • 10.4.2.Comparing calculable resistance standards up to 100 MHz with finite-element models
  • 10.4.3. Radiofrequency and microwave measurements of carbon nanotubes and graphene
  • References.