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|a 842936688
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|z (OCoLC)854971711
|z (OCoLC)1065685334
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|b Knovel Corporation
|n http://www.knovel.com
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|a TK7871.95
|b .G36 2010eb
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|a 621.3815/284
|2 23
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|a UAMI
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|a Gao, Jianjun,
|d 1968-
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245 |
1 |
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|a RF and microwave modeling and measurement techniques for compound field effect transistors /
|c Jianjun Gao.
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246 |
1 |
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|a RF and microwave modeling and measurement techniques for field effect transistors
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260 |
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|a Raleigh, NC :
|b SciTech Pub.,
|c ©2010.
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300 |
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|a 1 online resource (x, 339 pages) :
|b illustrations
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336 |
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|a text
|b txt
|2 rdacontent
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|a computer
|b c
|2 rdamedia
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|a online resource
|b cr
|2 rdacarrier
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|a Includes bibliographical references and index.
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|a Representation of Microwave Two-Port Network -- Microwave and RF Measurement Techniques -- FET Small Signal Modeling and Parameter Extraction -- FET Nonlinear Modeling and Parameter Extraction -- Microwave Noise Modeling and Parameter Extraction Technique for FETs -- Artificial Neural Network Modeling Technique for FET.
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|a "This book is an introduction to microwave and RF signal modeling and measurement techniques for field effect transistors. It assumes only a basic course in electronic circuits and prerequisite knowledge for readers to apply the techniques and improve the performance of integrated circuits, reduce design cycles and increase their chance at first time success. The first chapters offer a general overview and discussion of microwave signal and noise matrices, and microwave measurement techniques. The following chapters address modeling techniques for field effect transistors and cover models such as: small signal, large signal, noise, and the artificial neural network based."--Pub. desc.
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|a Print version record.
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|a Knovel
|b ACADEMIC - Aerospace & Radar Technology
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|a Field-effect transistors
|x Testing.
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|a Compound semiconductors
|x Testing.
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|a Field-effect transistors
|x Mathematical models.
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|a Compound semiconductors
|x Mathematical models.
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|a Microwave measurements.
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650 |
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|a Radio measurements.
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6 |
|a Transistors à effet de champ
|x Modèles mathématiques.
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|a Composés semi-conducteurs
|x Modèles mathématiques.
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|a Mesures micro-ondes.
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|a Mesures radioélectriques.
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|a TECHNOLOGY & ENGINEERING
|x Electronics
|x Transistors.
|2 bisacsh
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7 |
|a Compound semiconductors
|x Mathematical models.
|2 fast
|0 (OCoLC)fst00871818
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7 |
|a Field-effect transistors
|x Mathematical models.
|2 fast
|0 (OCoLC)fst00923929
|
650 |
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7 |
|a Microwave measurements.
|2 fast
|0 (OCoLC)fst01020233
|
650 |
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7 |
|a Radio measurements.
|2 fast
|0 (OCoLC)fst01087402
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7 |
|a measurement systems.
|2 inspect
|
650 |
|
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|a microwave field effect transistors.
|2 inspect
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776 |
0 |
8 |
|i Print version:
|a Gao, Jianjun, 1968-
|t RF and microwave modeling and measurement techniques for compound field effect transistors.
|d Raleigh, NC : SciTech Pub., ©2010
|z 9781891121890
|w (DLC) 2009017804
|w (OCoLC)320621684
|
856 |
4 |
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|u https://appknovel.uam.elogim.com/kn/resources/kpRFMMMTCH/toc
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