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Optical scattering : measurement and analysis /

As the authoritative resource on optical scattering, this book was developed from many years of teaching light-scatter measurement and analysis courses to optical engineers. Dr. Stover covers scattering beginning with its basics and covering surface roughness calculations, measurements, instrumentat...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Stover, John C.
Autor Corporativo: Society of Photo-optical Instrumentation Engineers
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Bellingham, Wash., USA : SPIE Optical Engineering Press, ©1995.
Edición:2nd ed.
Colección:SPIE monograph ; PM24.
Temas:
Acceso en línea:Texto completo
Descripción
Sumario:As the authoritative resource on optical scattering, this book was developed from many years of teaching light-scatter measurement and analysis courses to optical engineers. Dr. Stover covers scattering beginning with its basics and covering surface roughness calculations, measurements, instrumentation, predictions, specifications, and industrial applications. Also included are appendices that review the basics of wave propagation and Kirchhoff diffraction. Whether you're an optical engineer currently investigating roughness-induced haze in the semiconductor industry, or just entering the field of scatter metrology, this text will be invaluable.
Descripción Física:1 online resource (xiii, 321 pages) : illustrations
Bibliografía:Includes bibliographical references (pages 303-317) and index.
ISBN:9781615837397
1615837396
9780819419347
0819419346
9780819478443
081947844X