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|a IET Training Course on Microwave Measurement
|n (14th :
|d 2005 :
|c National Physical Laboratory in Teddington)
|
245 |
1 |
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|a Microwave measurements /
|c edited by R.J. Collier and A.D. Skinner.
|
250 |
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|a 3rd ed.
|
260 |
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|a London :
|b Institution of Engineering and Technology,
|c ©2007.
|
300 |
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|a 1 online resource (xx, 484 pages) :
|b illustrations
|
336 |
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|a text
|b txt
|2 rdacontent
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|a computer
|b c
|2 rdamedia
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|a online resource
|b cr
|2 rdacarrier
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|a data file
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|a IET electrical measurement series ;
|v 12
|
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|a "Contains most of the lecture notes used during the 14th IET Training Course on Microwave Measurement in May 2005 ... at the National Physical Laboratory in Teddington"--Preface
|
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|a Previous edition: London : Peter Peregrinus, 1989.
|
504 |
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|a Includes bibliographical references and index.
|
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0 |
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|a Print version record.
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520 |
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|a The book covers the following areas: microwave measurement.
|
505 |
0 |
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|a Transmission lines -- basic principles / R.J. Collier -- Scattering parameters and circuit analysis / P.R. Young -- Uncertainty and confidence in measurements / John Hurll -- Using coaxial connectors in measurement / Doug Skinner -- Attenuation measurement / Alan Coster -- RF voltage measurement / Paul C.A. Roberts -- Structures and properties of transmission lines / R.J. Collier -- Noise measurements / David Adamson -- Connectors, air lines and RF impedance / N.M. Ridler -- Microwave network analysers / Roger D. Pollard -- RFIC and MMIC measurement techniques / Stepan Lucyszyn -- Calibration of automatic network analysers / Ian Instone -- Verification of automatic network analysers / Ian Instone -- Balanced device characterisation / Bernd A. Schincke -- RF power measurement / James Miall -- Spectrum analyser measurements and applications / Doug Skinner -- Measurement of frequency stability and phase noise / David Owen -- Measurement of the dielectric properties of materials at RF and microwave frequences / Bob Clarke -- Calibration of ELF to UHF wire antennas, primarily for EMC testing / M.J. Alexander.
|
590 |
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|a Knovel
|b ACADEMIC - Electronics & Semiconductors
|
650 |
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0 |
|a Microwave measurements
|v Congresses.
|
650 |
|
6 |
|a Mesures micro-ondes
|v Congrès.
|
650 |
|
7 |
|a TECHNOLOGY & ENGINEERING
|x Microwaves.
|2 bisacsh
|
650 |
|
7 |
|a Microwave measurements
|2 fast
|
650 |
|
7 |
|a microwave measurement.
|2 inspect
|
650 |
|
7 |
|a Microondes.
|2 ram
|
655 |
|
7 |
|a Conference papers and proceedings
|2 fast
|
700 |
1 |
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|a Collier, R. J.
|q (Richard J.)
|
700 |
1 |
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|a Skinner, A. D.
|q (A. Douglas)
|
710 |
2 |
|
|a Institution of Engineering and Technology.
|
776 |
0 |
8 |
|i Print version:
|a IET Training Course on Microwave Measurement (14th : 2005 : National Physical Laboratory in Teddington).
|t Microwave measurements.
|b 3rd ed.
|d London : Institution of Engineering and Technology, ©2007
|z 9780863417351
|w (OCoLC)182563125
|
830 |
|
0 |
|a IET electrical measurement series ;
|v 12.
|
856 |
4 |
0 |
|u https://appknovel.uam.elogim.com/kn/resources/kpIETEMSV1/toc
|z Texto completo
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