Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approach /

Annotation

Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor Corporativo: Institution of Engineering and Technology
Otros Autores: Sun, Yichuang (Editor )
Formato: Electrónico eBook
Idioma:Inglés
Publicado: London : Institution of Engineering and Technology, 2008.
Colección:IET circuits, devices and systems series ; 19.
Temas:
Linear integrated circuits > Testing.
Mixed signal circuits > Testing.
Radio frequency integrated circuits > Testing.
TECHNOLOGY & ENGINEERING > Electronics > Circuits > Integrated.
TECHNOLOGY & ENGINEERING > Electronics > Circuits > General.
Linear integrated circuits > Testing
Mixed signal circuits > Testing
Acceso en línea:Texto completo
Tabla de Contenidos:
  • Fault diagnosis of linear and non-linear analogue circuits / Yichuang Sun
  • Symbolic function approaches for analogue fault diagnosis / Stefano Manetti and Maria Cristina Piccirilli
  • Neural-network-based approaches for analogue circuit fault diagnosis / Yichuang Sun and Yigang He
  • Hierarchical/decomposition techniques for large-scale analogue diagnosis / Peter Shepherd
  • DFT and BIST techniques for analogue and mixed-signal test / Mona Safi-Harb and Gordon Roberts
  • Design-for-testability of analogue filters / Yichuang Sun and Masood-ul Hasan
  • Test of A/D converters: from converter characteristics to built-in self-test proposals / Andreas Lechner and Andrew Richardson
  • Test of [Sigma Delta] converters / Gildas Leger and Adoracion Rueda
  • Phase-locked loop test methodologies: current characterization and production test practices / Martin John Burbidge and Andrew Richardson
  • On-chip testing techniques for RF wirless transceiver systems and components / Alberto Valdes-Garcia, Jose Silva-Martinez, Edgar Sanchez-Sinencio
  • Tuning and calibration of analogue, mixed-signal and RF circuits / James Moritz and Yichuang Sun.

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