Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approach /

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor Corporativo: Institution of Engineering and Technology
Otros Autores: Sun, Yichuang (Editor )
Formato: Electrónico eBook
Idioma:Inglés
Publicado: London : Institution of Engineering and Technology, 2008.
Colección:IET circuits, devices and systems series ; 19.
Temas:
Linear integrated circuits > Testing.
Mixed signal circuits > Testing.
Radio frequency integrated circuits > Testing.
TECHNOLOGY & ENGINEERING > Electronics > Circuits > Integrated.
TECHNOLOGY & ENGINEERING > Electronics > Circuits > General.
Linear integrated circuits > Testing
Mixed signal circuits > Testing
Acceso en línea:Texto completo

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