Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approach /

Annotation

Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor Corporativo: Institution of Engineering and Technology
Otros Autores: Sun, Yichuang (Editor )
Formato: Electrónico eBook
Idioma:Inglés
Publicado: London : Institution of Engineering and Technology, 2008.
Colección:IET circuits, devices and systems series ; 19.
Temas:
Linear integrated circuits > Testing.
Mixed signal circuits > Testing.
Radio frequency integrated circuits > Testing.
TECHNOLOGY & ENGINEERING > Electronics > Circuits > Integrated.
TECHNOLOGY & ENGINEERING > Electronics > Circuits > General.
Linear integrated circuits > Testing
Mixed signal circuits > Testing
Acceso en línea:Texto completo

MARC

LEADER 00000cam a2200000Ma 4500
001 KNOVEL_ocn456124034
003 OCoLC
005 20231027140348.0
006 m o d
007 cr cnu---unuuu
008 081106s2008 enka ob 001 0 eng d
040 |a CtWfDGI  |b eng  |e pn  |c QE2  |d IWA  |d N$T  |d YDXCP  |d OCLCQ  |d IDEBK  |d E7B  |d OCLCQ  |d B24X7  |d EBLCP  |d OCLCO  |d OCLCQ  |d CUS  |d OCLCQ  |d KNOVL  |d GZM  |d DEBSZ  |d ZCU  |d KNOVL  |d COO  |d OCLCQ  |d VT2  |d OCLCQ  |d AGLDB  |d OTZ  |d MERUC  |d OCLCQ  |d OCLCF  |d VTS  |d CEF  |d RRP  |d AU@  |d OCLCQ  |d WYU  |d YOU  |d STF  |d M8D  |d OCLCQ  |d K6U  |d OCLCQ  |d EYM  |d OCLCO  |d OCLCQ  |d OCLCO 
016 7 |a 014235535  |2 Uk 
019 |a 424642044  |a 623468726  |a 646795920  |a 650987986  |a 712981930  |a 961879283  |a 988692949  |a 994979555  |a 999474246  |a 1058085541  |a 1058505476  |a 1062909114 
020 |a 9780863419997  |q (electronic bk.) 
020 |a 0863419992  |q (electronic bk.) 
020 |a 9781615833153  |q (electronic bk.) 
020 |a 1615833153  |q (electronic bk.) 
020 |z 9780863417450 
020 |z 0863417450 
029 1 |a AU@  |b 000045615267 
029 1 |a AU@  |b 000048548112 
029 1 |a AU@  |b 000051416644 
029 1 |a DEBBG  |b BV043168471 
029 1 |a DEBSZ  |b 32565428X 
029 1 |a DEBSZ  |b 421950625 
029 1 |a DEBSZ  |b 449139115 
029 1 |a DEBSZ  |b 454889666 
029 1 |a NZ1  |b 13309917 
029 1 |a NZ1  |b 15619352 
035 |a (OCoLC)456124034  |z (OCoLC)424642044  |z (OCoLC)623468726  |z (OCoLC)646795920  |z (OCoLC)650987986  |z (OCoLC)712981930  |z (OCoLC)961879283  |z (OCoLC)988692949  |z (OCoLC)994979555  |z (OCoLC)999474246  |z (OCoLC)1058085541  |z (OCoLC)1058505476  |z (OCoLC)1062909114 
037 |b Knovel Corporation  |n http://www.knovel.com 
050 4 |a TK7874.654  |b .T47 2008eb 
072 7 |a TEC  |x 008020  |2 bisacsh 
072 7 |a TEC  |x 008010  |2 bisacsh 
082 0 4 |a 621.38150287  |2 22 
049 |a UAMI 
245 0 0 |a Test and diagnosis of analogue, mixed-signal and RF integrated circuits :  |b the system on chip approach /  |c edited by Yichuang Sun. 
260 |a London :  |b Institution of Engineering and Technology,  |c 2008. 
300 |a 1 online resource (xx, 389 pages) :  |b illustrations 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
490 1 |a Circuits, devices and systems series ;  |v 19 
500 |a Title from title screen. 
504 |a Includes bibliographical references and index. 
520 8 |a Annotation  |b This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. It contains eleven chapters by leading researchers worldwide. As well as fundamental concepts and techniques, the book reports systematically the state of the arts and future research directions of these areas. A complete range of circuit components are covered and test issues from the SoC perspective. An essential reference for researchers and engineers in mixed signal testing, postgraduate and senior undergraduate students. 
505 0 |a Fault diagnosis of linear and non-linear analogue circuits / Yichuang Sun -- Symbolic function approaches for analogue fault diagnosis / Stefano Manetti and Maria Cristina Piccirilli -- Neural-network-based approaches for analogue circuit fault diagnosis / Yichuang Sun and Yigang He -- Hierarchical/decomposition techniques for large-scale analogue diagnosis / Peter Shepherd -- DFT and BIST techniques for analogue and mixed-signal test / Mona Safi-Harb and Gordon Roberts -- Design-for-testability of analogue filters / Yichuang Sun and Masood-ul Hasan -- Test of A/D converters: from converter characteristics to built-in self-test proposals / Andreas Lechner and Andrew Richardson -- Test of [Sigma Delta] converters / Gildas Leger and Adoracion Rueda -- Phase-locked loop test methodologies: current characterization and production test practices / Martin John Burbidge and Andrew Richardson -- On-chip testing techniques for RF wirless transceiver systems and components / Alberto Valdes-Garcia, Jose Silva-Martinez, Edgar Sanchez-Sinencio -- Tuning and calibration of analogue, mixed-signal and RF circuits / James Moritz and Yichuang Sun. 
590 |a Knovel  |b ACADEMIC - Electronics & Semiconductors 
650 0 |a Linear integrated circuits  |x Testing. 
650 0 |a Mixed signal circuits  |x Testing. 
650 0 |a Radio frequency integrated circuits  |x Testing. 
650 7 |a TECHNOLOGY & ENGINEERING  |x Electronics  |x Circuits  |x Integrated.  |2 bisacsh 
650 7 |a TECHNOLOGY & ENGINEERING  |x Electronics  |x Circuits  |x General.  |2 bisacsh 
650 7 |a Linear integrated circuits  |x Testing  |2 fast 
650 7 |a Mixed signal circuits  |x Testing  |2 fast 
700 1 |a Sun, Yichuang.  |4 edt 
710 2 |a Institution of Engineering and Technology. 
776 0 8 |i Print version:  |t Test and diagnosis of analogue, mixed-signal and RF integrated circuits.  |d London : Institution of Engineering and Technology, 2008  |z 9780863417450  |w (OCoLC)180473599 
830 0 |a IET circuits, devices and systems series ;  |v 19. 
856 4 0 |u https://appknovel.uam.elogim.com/kn/resources/kpTDAMSRF1/toc  |z Texto completo 
938 |a Books 24x7  |b B247  |n bke00019466 
938 |a EBL - Ebook Library  |b EBLB  |n EBL407982 
938 |a ebrary  |b EBRY  |n ebr10275428 
938 |a EBSCOhost  |b EBSC  |n 292173 
938 |a YBP Library Services  |b YANK  |n 2955158 
994 |a 92  |b IZTAP 

Ejemplares similares