VLSI test principles and architectures : design for testability /

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This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of indu...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Otros Autores: Wang, Laung-Terng (Editor ), Wu, Cheng-Wen, EE Ph. D. (Editor ), Wen, Xiaoqing (Editor )
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Amsterdam ; Boston : Elsevier Morgan Kaufmann Publishers, [2006]
Colección:Morgan Kaufmann series in systems on silicon.
Temas:
Integrated circuits > Very large scale integration > Testing.
Integrated circuits > Very large scale integration > Design.
Integrated circuits > Very large scale integration > Design and construction.
Circuits intégrés à très grande échelle > Essais.
Circuits intégrés à très grande échelle > Conception et construction.
TECHNOLOGY & ENGINEERING > Electronics > Circuits > VLSI & ULSI.
TECHNOLOGY & ENGINEERING > Electronics > Circuits > Logic.
COMPUTERS > Logic Design.
Testen
VLSI
Circuitos integrados vlsi.
Acceso en línea:Texto completo
Descripción
Sumario:This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures. Lecture slides and exercise solutions for all chapters are now available. Instructors are also eligible for downloading PPT slide files and MSWORD solutions files from the manual website.
Descripción Física:1 online resource (xxx, 777 pages) : illustrations
Bibliografía:Includes bibliographical references and index.
ISBN:9780080474793
0080474799

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