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Properties of porous silicon /

Detalles Bibliográficos
Clasificación:	Libro Electrónico
Autor Corporativo:	INSPEC (Information service)
Otros Autores:	Canham, Leigh T.
Formato:	Electrónico eBook
Idioma:	Inglés
Publicado:	London : IEE : INSPEC, ©1987.
Colección:	EMIS datareviews series ; no. 18.
Temas:	Porous silicon. Semiconductors. Silicium poreux. Semi-conducteurs. semiconductor. Porous silicon Semiconductors Semiconducteurs. Optoélectronique. Silicium. Matériaux poreux.
Acceso en línea:	Texto completo

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