Encyclopedia of materials characterization : surfaces, interfaces, thin films /

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Encyclopedia of Materials Characterization is a comprehensive volume on analytical techniques used in materials science for the characterization of surfaces, interfaces and thin films. This flagship volume in the Materials Characterization Series is a unique, stand-alone reference for materials scie...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Otros Autores: Brundle, C. R., Evans, Charles A., Wilson, Shaun
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Boston : Greenwich, CT : Butterworth-Heinemann ; Manning, ©1992.
Colección:Materials characterization series.
Temas:
Surfaces (Technology) > Testing.
Chemical & Materials Engineering.
Engineering & Applied Sciences.
Materials Science.
Spectroscopie.
Matériaux.
Science des matériaux.
Méthodes de recherche.
Surfaces (Technology) > Testing
Messtechnik
Dünne Schicht
Stoffeigenschaft
Oberflächeneigenschaft
Grenzfläche
Oberflächenanalyse
Werkstoff
Engenharia metalurgica e de materiais.
Surfaces (technologie)
Matériaux > Analyse.
Essais (technologie)
Surfaces > Analysis
Acceso en línea:Texto completo
Tabla de Contenidos:
  • Introduction and summaries
  • Imaging techniques (Microscopy)
  • Electron beam instruments
  • Structure determination by diffraction and scattering
  • Electron emission spectroscopies
  • X-ray emission techniques
  • Visible/UV emission, reflection, and absorption
  • Vibrational spectroscopies and NMR
  • Ion scattering techniques
  • Mass and optical spectroscopies
  • Neutron and nuclear techniques
  • Physical and magnetic properties.

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