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Handbook of compound semiconductors : growth, processing, characterization, and devices /

This book reviews the advances and technologies used to produce microelectronic and optoelectronic devices from compound semiconductors. It provides an overview of the technologies necessary to grow bulk single-crystal substrates, grow hetero-or homoepitaxial films, and process advanced devices such...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Otros Autores: Holloway, Paul H., McGuire, G. E.
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Park Ridge, N.J., U.S.A. : Noyes Publications, ©1995.
Colección:Materials science and process technology series. Electronic materials and process technology.
Temas:
Acceso en línea:Texto completo

MARC

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245 0 0 |a Handbook of compound semiconductors :  |b growth, processing, characterization, and devices /  |c edited by Paul H. Holloway, Gary E. McGuire. 
260 |a Park Ridge, N.J., U.S.A. :  |b Noyes Publications,  |c ©1995. 
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490 1 |a Materials science and process technology series. Electronic materials and process technology 
520 |a This book reviews the advances and technologies used to produce microelectronic and optoelectronic devices from compound semiconductors. It provides an overview of the technologies necessary to grow bulk single-crystal substrates, grow hetero-or homoepitaxial films, and process advanced devices such as HBT's, QW diode lasers, etc. 
504 |a Includes bibliographical references and index. 
505 0 |a Bulk Crystal Growth -- MOCVD of Compound Semiconductor Layers -- Molecular Beam Epitaxy -- Physical and Chemical Deposition of Metals as Ohmic Contacts to InP and Related Materials -- Surface Processing of III-V Semiconductors -- Ion Implantation Induced Extended Defects in GaAs -- Passivation of GaAs and InP -- Wet and Dry Etching of Compound Semiconductors -- Rapid Isothermal Processing (RIP) -- Epitaxial Lift-Off for Thin Film Compound Semiconductor Devices -- Packaging -- Chemical, Structural and Electronic Characterization of Compound Semiconductor Surfaces and Interfaces by X-ray Photoelectron Spectroscopy and Diffraction Techniques -- Characterization of Compound Semiconductor Material by Ion Beams -- Optical Characterization of Compound Semiconductors -- Gallium Arsenide Microelectronic Devices and Circuits -- Optoelectronic Devices -- Acknowledgments -- References -- Index. 
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