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Stuck : why Asian Americans don't reach the top of the corporate ladder /
"In the classroom, Asian Americans, often singled out as so-called 'model minorities,' are expected to be top of the class. Often they are, getting straight As and gaining admission to elite colleges and universities. But the corporate world is a different story. As Margaret M. Chin r...
| Clasificación: | Libro Electrónico |
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| Autor principal: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
New York :
New York University Press,
[2020]
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| Temas: | |
| Acceso en línea: | Texto completo |
| Sumario: | "In the classroom, Asian Americans, often singled out as so-called 'model minorities,' are expected to be top of the class. Often they are, getting straight As and gaining admission to elite colleges and universities. But the corporate world is a different story. As Margaret M. Chin reveals in this important new book, many Asian Americans get stuck on the corporate ladder, never reaching the top. In Stuck, Chin shows that there is a 'bamboo ceiling' in the workplace, describing a corporate world where racial and ethnic inequalities prevent upward mobility. Drawing on interviews with second-generation Asian Americans, she examines why they fail to advance as fast or as high as their colleagues, showing how they lose out on leadership positions, executive roles, and entry to the coveted boardroom suite over the course of their careers. An unfair lack of trust from their coworkers, absence of role models, sponsors and mentors, and for women, sexual harassment and prejudice especially born at the intersection of race and gender are only a few of the factors that hold Asian American professionals back. Ultimately, Chin sheds light on the experiences of Asian Americans in the workplace, providing insight into and a framework of who is and isn't granted access into the upper echelons of American society, and why."-- |
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| Descripción Física: | 1 online resource (221 pages) : illustrations. |
| Bibliografía: | Includes bibliographical references (pages 185-205) and index. |
| ISBN: | 1479873802 9781479873807 |