Measuring deeper learning through cognitively demanding test items : results from the analysis of six national and international exams /
Clasificación: | Libro Electrónico |
---|---|
Autores principales: | Yuan, Kun (Autor), Le, Vi-Nhuan (Autor) |
Formato: | Electrónico eBook |
Idioma: | Inglés |
Publicado: |
Santa Monica, CA :
RAND Corporation,
[2014]
|
Colección: | Research report (Rand Corporation)
|
Temas: | |
Acceso en línea: | Texto completo |
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