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Quantum metrology with photoelectrons. Volume 1, Foundations /
Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelect...
| Clasificación: | Libro Electrónico |
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| Autor principal: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
San Rafael [California] (40 Oak Drive, San Rafael, CA, 94903, USA) :
Morgan & Claypool Publishers,
[2018]
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| Colección: | IOP (Series). Release 4.
IOP concise physics. |
| Temas: | |
| Acceso en línea: | Texto completo |
| Sumario: | Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 1: Foundations discusses the fundamental concepts along with recent and emerging applications. |
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| Notas: | "Version: 20180401"--Title page verso. "A Morgan & Claypool publication as part of IOP Concise Physics"--Title page verso. |
| Descripción Física: | 1 online resource (various pagings) : illustrations (chiefly color). Also available in print. |
| Bibliografía: | Includes bibliographical references. |
| ISBN: | 9781681746845 9781681746869 |
| ISSN: | 2053-2571 |