Confocal microscopy /

The confocal microscope is appropriate for imaging cells or the measurement of industrial artefacts. However, junior researchers and instrument users sometimes misuse imaging concepts and metrological characteristics, such as position resolution in industrial metrology and scale resolution in bio-im...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores principales: Liu, Jian (Professor of electronic engineering and automation) (Autor), Tan, J. (Jiubin) (Autor)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: San Rafael [California] (40 Oak Drive, San Rafael, CA, 94903, USA) : Morgan & Claypool Publishers, [2016]
Colección:IOP concise physics.
IOP (Series). Release 3.
Temas:
Confocal microscopy.
Microscopy.
Laser Physics.
SCIENCE / Microscopes & Microscopy.
SCIENCE / Physics / Optics & Light.
SCIENCE / Scientific Instruments.
Acceso en línea:Texto completo
Tabla de Contenidos:
  • Preface
  • 1. Confocal microscopy and its application in China
  • 1.1. A brief review of confocal microscopy
  • 1.2. Resolution
  • 1.3. Standardization in China
  • 2. Point spread function model
  • 2.1. Lens imaging
  • 2.2. PSF in confocal imaging
  • 3. Incoherent three-dimensional optical transfer function
  • 3.1. Development of 3D optical transfer function
  • 3.2. 3D imaging models of CM
  • 3.3. 3D-OTF of CM
  • 3.4. 3D-OTF of differential
  • 4. Decoupling criteria for three-dimensional optical microscopic measurement
  • 4.1. Introduction
  • 4.2. Decoupling model for the measurement of thin samples
  • 4.3. Decoupling model for the measurement of a deep groove sample
  • 4.4. Experiments
  • 5. Pupil filter design
  • 5.1. Phase rotation transformation
  • 5.2. The design method of filters with global minimizing side lobes
  • 6. Confocal axial peak extraction algorithm
  • 6.1. Introduction
  • 6.2. Centroid method for localization of confocal peak
  • 6.3. Nonlinear fitting method for peak localization
  • 6.4. Deviation analysis for localization of confocal axial peak
  • 7. Differential confocal microscopy
  • 7.1. Introduction
  • 7.2. Application of DCM in China
  • 7.3. The Basic principle of DDCM
  • 8. Medium aided scattering measurement
  • 8.1. Introduction
  • 8.2. The principle of medium aided scattering confocal microscopy
  • 8.3. Analysis of deposition uniformity of a fluorescent medium layer
  • 8.4. Error analysis and height correction of the medium layer
  • 8.5. Application of medium aided scattering confocal microscopy
  • 9. Scanning technology
  • 9.1. Introduction
  • 9.2. Scanners
  • 9.3. Raster scanning
  • 9.4. [alpha]-[beta] circular scanning
  • 10. Confocal profilometer
  • 10.1. Introduction
  • 10.2. Basic principle
  • 10.3. The extraction method of discrete surface
  • 10.4. Application of confocal profilometer.

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