Nanometrology using the transmission electron microscope /

The Transmission Electron Microscope (TEM) is the ultimate tool to see and measure structures on the nanoscale and to probe their elemental composition and electronic structure with sub-nanometer spatial resolution. Recent technological breakthroughs have revolutionized our understanding of material...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Stolojan, Vlad (Autor)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: San Rafael [California] (40 Oak Drive, San Rafael, CA, 94903, USA): Morgan & Claypool Publishers, [2015]
Colección:IOP (Series). Release 2.
IOP concise physics.
Temas:
Microstructure > Measurement.
Metrology.
Transmission electron microscopes.
Microscopy.
SCIENCE / Electron Microscopes & Microscopy.
Acceso en línea:Texto completo
Tabla de Contenidos:
  • Preface
  • Acknowledgements
  • Author biography
  • 1. Introduction
  • 1.1. The TEM
  • 2. Imaging
  • 2.1. Resolution
  • 2.2. Image calibration
  • 2.3. Sample orientation
  • 2.4. Modes of imaging and diffraction
  • 3. Spectroscopy
  • 3.1. EDX
  • 3.2. EELS.

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