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Nanometrology using the transmission electron microscope /
The Transmission Electron Microscope (TEM) is the ultimate tool to see and measure structures on the nanoscale and to probe their elemental composition and electronic structure with sub-nanometer spatial resolution. Recent technological breakthroughs have revolutionized our understanding of material...
| Clasificación: | Libro Electrónico |
|---|---|
| Autor principal: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
San Rafael [California] (40 Oak Drive, San Rafael, CA, 94903, USA):
Morgan & Claypool Publishers,
[2015]
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| Colección: | IOP (Series). Release 2.
IOP concise physics. |
| Temas: | |
| Acceso en línea: | Texto completo |