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Nanometrology using the transmission electron microscope /
The Transmission Electron Microscope (TEM) is the ultimate tool to see and measure structures on the nanoscale and to probe their elemental composition and electronic structure with sub-nanometer spatial resolution. Recent technological breakthroughs have revolutionized our understanding of material...
| Clasificación: | Libro Electrónico |
|---|---|
| Autor principal: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
San Rafael [California] (40 Oak Drive, San Rafael, CA, 94903, USA):
Morgan & Claypool Publishers,
[2015]
|
| Colección: | IOP (Series). Release 2.
IOP concise physics. |
| Temas: | |
| Acceso en línea: | Texto completo |
MARC
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| 008 | 150101s2015 caua ob 000 0 eng d | ||
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| 020 | |z 9781681740560 |q print | ||
| 024 | 7 | |a 10.1088/978-1-6817-4120-8 |2 doi | |
| 035 | |a (CaBNVSL)thg00931906 | ||
| 035 | |a (OCoLC)922908104 | ||
| 040 | |a CaBNVSL |b eng |e rda |c CaBNVSL |d CaBNVSL | ||
| 050 | 4 | |a QC176.8.N35 |b S766 2015eb | |
| 072 | 7 | |a PDND |2 bicssc | |
| 072 | 7 | |a SCI023000 |2 bisacsh | |
| 082 | 0 | 4 | |a 620.5 |2 23 |
| 100 | 1 | |a Stolojan, Vlad, |e author. | |
| 245 | 1 | 0 | |a Nanometrology using the transmission electron microscope / |c Vlad Stolojan. |
| 264 | 1 | |a San Rafael [California] (40 Oak Drive, San Rafael, CA, 94903, USA): |b Morgan & Claypool Publishers, |c [2015] | |
| 264 | 2 | |a Bristol [England] (Temple Circus, Temple Way, Bristol BS1 6HG, UK) : |b IOP Publishing, |c [2015] | |
| 300 | |a 1 online resource (various pagings) : |b illustrations (some color). | ||
| 336 | |a text |2 rdacontent | ||
| 337 | |a electronic |2 isbdmedia | ||
| 338 | |a online resource |2 rdacarrier | ||
| 490 | 1 | |a IOP concise physics, |x 2053-2571 | |
| 490 | 1 | |a [IOP release 2] | |
| 500 | |a "Version: 20140901"--Title page verso. | ||
| 500 | |a "A Morgan & Claypool publication as part of IOP Concise Physics"--Title page verso. | ||
| 504 | |a Includes bibliographical references. | ||
| 505 | 0 | |a Preface -- Acknowledgements -- Author biography -- 1. Introduction -- 1.1. The TEM | |
| 505 | 8 | |a 2. Imaging -- 2.1. Resolution -- 2.2. Image calibration -- 2.3. Sample orientation -- 2.4. Modes of imaging and diffraction | |
| 505 | 8 | |a 3. Spectroscopy -- 3.1. EDX -- 3.2. EELS. | |
| 520 | 3 | |a The Transmission Electron Microscope (TEM) is the ultimate tool to see and measure structures on the nanoscale and to probe their elemental composition and electronic structure with sub-nanometer spatial resolution. Recent technological breakthroughs have revolutionized our understanding of materials via use of the TEM, and it promises to become a significant tool in understanding biological and bio-molecular systems such as viruses and DNA molecules. This book is a practical guide for scientists who need to use the TEM as a tool to answer questions about physical and chemical phenomena on the nanoscale. | |
| 521 | |a Scientists using Transmission Electron Microscopes in materials science, biology, life science, chemistry. | ||
| 530 | |a Also available in print. | ||
| 538 | |a Mode of access: World Wide Web. | ||
| 538 | |a System requirements: Adobe Acrobat Reader. | ||
| 545 | |a Dr. Vlad Stolojan is a Lecturer in Nanomaterials Characterisation, working in the Advanced Technology Institute as part of the Nano-Electronics Centre. He is a member of the Institute of Physics and a fellow of the Royal Microscopical Society. Dr Stolojan is an alumnus of University of East Anglia (BSc Physics, 1996) and of the University of Cambridge (PhD Physics, 2001: Nanochemistry of grain boundaries in iron). He first joined the University of Surrey's School of Engineering in 2001 as an expert in electron microscopy and energy-loss spectroscopy, continuing as an RCUK Fellow with the University of Surrey's Electronic Engineering department, in Professor Ravi Silva's group. Dr Stolojan is an author of more than 80 peer-reviewed publications, a reviewer for a number of journals (Carbon, Applied Surface Science, Ultramicroscopy, etc) and a member of the Materials Engineering and Nanotechnology Panel of the National Council for Certification of University Degrees, Romania (CNATDCU). | ||
| 588 | 0 | |a Title from PDF title page (viewed on October 1, 2015). | |
| 650 | 0 | |a Microstructure |x Measurement. | |
| 650 | 0 | |a Metrology. | |
| 650 | 0 | |a Transmission electron microscopes. | |
| 650 | 7 | |a Microscopy. |2 bicssc | |
| 650 | 7 | |a SCIENCE / Electron Microscopes & Microscopy. |2 bisacsh | |
| 710 | 2 | |a Morgan & Claypool Publishers, |e publisher. | |
| 710 | 2 | |a Institute of Physics (Great Britain), |e publisher. | |
| 776 | 0 | 8 | |i Print version: |z 9781681740560 |
| 830 | 0 | |a IOP (Series). |p Release 2. | |
| 830 | 0 | |a IOP concise physics. | |
| 856 | 4 | 0 | |u https://iopscience.uam.elogim.com/book/978-1-6817-4120-8 |z Texto completo |