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Nanometrology using the transmission electron microscope /

The Transmission Electron Microscope (TEM) is the ultimate tool to see and measure structures on the nanoscale and to probe their elemental composition and electronic structure with sub-nanometer spatial resolution. Recent technological breakthroughs have revolutionized our understanding of material...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Stolojan, Vlad (Autor)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: San Rafael [California] (40 Oak Drive, San Rafael, CA, 94903, USA): Morgan & Claypool Publishers, [2015]
Colección:IOP (Series). Release 2.
IOP concise physics.
Temas:
Acceso en línea:Texto completo
Descripción
Sumario:The Transmission Electron Microscope (TEM) is the ultimate tool to see and measure structures on the nanoscale and to probe their elemental composition and electronic structure with sub-nanometer spatial resolution. Recent technological breakthroughs have revolutionized our understanding of materials via use of the TEM, and it promises to become a significant tool in understanding biological and bio-molecular systems such as viruses and DNA molecules. This book is a practical guide for scientists who need to use the TEM as a tool to answer questions about physical and chemical phenomena on the nanoscale.
Notas:"Version: 20140901"--Title page verso.
"A Morgan & Claypool publication as part of IOP Concise Physics"--Title page verso.
Descripción Física:1 online resource (various pagings) : illustrations (some color).
Also available in print.
Público:Scientists using Transmission Electron Microscopes in materials science, biology, life science, chemistry.
Bibliografía:Includes bibliographical references.
ISBN:9781681741208
9781681742489
ISSN:2053-2571