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Radiative properties of semiconductors /

Optical properties, particularly in the infrared range of wavelengths, continue to be of enormous interest to both material scientists and device engineers. The need for the development of standards for data of optical properties in the infrared range of wavelengths is very timely considering the on...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores principales: Ravindra, N. M. (Nuggehalli M.) (Autor), Marthi, Sita Rajyalaxmi (Autor), Ba<U+0084>nobre, Asahel (Autor)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: San Rafael [California] (40 Oak Drive, San Rafael, CA, 94903, USA) : Morgan & Claypool Publishers, [2017]
Colección:IOP (Series). Release 3.
IOP concise physics.
Temas:
Acceso en línea:Texto completo
Tabla de Contenidos:
  • Preface
  • Foreword
  • 1. Introduction to radiative properties
  • 1.1. Introduction
  • 1.2. Properties
  • 2. Optical and thermal properties
  • 2.1. Optical properties
  • 3. Instrumentation
  • 3.1. Spectral emissometer
  • 3.2. Czochralski crystal puller
  • 3.3. Polarized radiometer
  • 3.4. Rotating polarizer ellipsometer
  • 4. Silicon
  • 4.1. Influence of coatings on emissivity
  • 5. Germanium
  • 6. Graphene
  • 7. Silicon carbide
  • 8. Gallium arsenide
  • 9. Gallium nitride
  • 10. Indium antimonide
  • 11. Indium phosphide
  • 12. Cadmium telluride
  • 13. Mercury cadmium telluride
  • 14. Modeling
  • 15. Applications
  • 15.1. Silicon
  • 15.2. Germanium
  • 15.3. Graphene
  • 15.4. Silicon carbide
  • 15.5. Gallium arsenide
  • 15.6. Gallium nitride
  • 15.7. Indium antimonide
  • 15.8. Indium phosphide
  • 15.9. Cadmium tellurid
  • 15.10. Mercury cadmium telluride
  • 16. Global infrastructure for emissivity measurements--examples
  • 16.1. NIST
  • 16.2. NPL
  • 16.3. Shimadzu
  • 16.4. NREL.