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An introduction to time-of-flight secondary ion mass spectrometry (ToF-SIMS) and its application to materials science /
This book highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of materials. While providing a brief overview of the principles of SIMS, it also provides examples of how dual-beam ToF-SIMS is used to investi...
| Clasificación: | Libro Electrónico |
|---|---|
| Autor principal: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
San Rafael [California] (40 Oak Drive, San Rafael, CA, 94903, USA) :
Morgan & Claypool Publishers,
[2015]
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| Colección: | IOP (Series). Release 2.
IOP concise physics. |
| Temas: | |
| Acceso en línea: | Texto completo |