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Optics : the science of light /

The study of light has been an important part of science from its beginning. The ancient Greeks and, prior to the Middle Ages, Islamic scholars provided important insights. With the coming of the Scientific Revolution in the 16th and 17th centuries, optics, in the shape of telescopes and microscopes...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Ewart, Paul (Physicist) (Autor)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: San Rafael [California] (40 Oak Drive, San Rafael, CA, 94903, USA) : Morgan & Claypool Publishers, [2019]
Colección:IOP (Series). Release 6.
IOP concise physics.
Temas:
Acceso en línea:Texto completo
Tabla de Contenidos:
  • 1. Introduction and structure of the course
  • 2. Geometrical optics
  • 2.1. Fermat's principle
  • 2.2. Lenses and principal planes
  • 2.3. Compound lens systems
  • 2.4. Illumination of optical systems
  • 3. Waves and diffraction
  • 3.1. Mathematical description of a wave
  • 3.2. Interference
  • 3.3. Phasors
  • 3.4. Diffraction from a finite slit
  • 3.5. Diffraction from a finite slit : phasor treatment
  • 3.6. Diffraction in two dimensions
  • 4. Fraunhofer diffraction
  • 4.1. Fraunhofer diffraction
  • 4.2. Diffraction and wave propagation
  • 5. Fourier methods in optics
  • 5.1. The Fresnel-Kirchhoff integral as a Fourier transform
  • 5.2. The convolution theorem
  • 5.3. Some useful Fourier transforms and convolutions
  • 5.4. Fourier analysis
  • 5.5. Spatial frequencies
  • 5.6. Abbé theory of imaging
  • 5.7. Spatial resolution of the compound microscope
  • 5.8. Diffraction effects on image brightness
  • 6. Optical instruments and fringe localisation
  • 6.1. Division of wavefront
  • 6.2. Division of amplitude
  • 7. The diffraction grating spectrograph
  • 7.1. Interference pattern from a diffraction grating
  • 7.2. Effect of finite slit width
  • 7.3. Diffraction grating performance
  • 7.4. Blazed (reflection) gratings
  • 7.5. Effect of slit width on resolution and illumination
  • 8. The Michelson (Fourier transform) interferometer
  • 8.1. Michelson interferometer
  • 8.2. Resolving power of the Michelson spectrometer
  • 8.3. The Fourier transform spectrometer
  • 8.4. The Wiener-Khinchin theorem
  • 8.5. Fringe visibility
  • 9. The Fabry-Pérot interferometer
  • 9.1. The Fabry-Pérot interference pattern
  • 9.2. Observing Fabry-Pérot fringes
  • 9.3. Finesse
  • 9.4. The instrument width
  • 9.5. Free spectral range, FSR
  • 9.6. Resolving power
  • 9.7. Practical matters
  • 9.8. Instrument function and instrument width
  • 10. Reflection at dielectric surfaces and boundaries
  • 10.1. Electromagnetic waves at dielectric boundaries
  • 10.2. Reflection properties of a single dielectric layer
  • 10.3. Anti-reflection coatings
  • 10.4. Multiple dielectric layers : matrix method
  • 10.5. High reflectance mirrors
  • 10.6. Interference filters
  • 10.7. Reflection and transmission at oblique incidence
  • 10.8. Deductions from Fresnel's equations
  • 11. Polarized light
  • 11.1. Polarization states
  • 11.2. Transformation and analysis of states of polarization
  • 11.3. Optics of anisotropic media; birefringence
  • 11.4. Production and manipulation of polarized light
  • 11.5. Analysis of polarized light
  • 11.6. Interference of polarized light.