Neutron and x-ray reflectometry : emerging phenomena at heterostructure interfaces /
This book presents x-ray and neutron reflectometry techniques and how they can be used to explore interface structure and magnetism at mesoscopic length scale in thin films and multilayers.
Clasificación: | Libro Electrónico |
---|---|
Autores principales: | Basu, Saibal (Autor), Singh, Surendra (Ph. D. in physics) (Autor) |
Formato: | Electrónico eBook |
Idioma: | Inglés |
Publicado: |
Bristol [England] (Temple Circus, Temple Way, Bristol BS1 6HG, UK) :
IOP Publishing,
[2022]
|
Colección: | IOP (Series). Release 22.
IOP ebooks. 2022 collection. |
Temas: | |
Acceso en línea: | Texto completo |
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