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Neutron and x-ray reflectometry : emerging phenomena at heterostructure interfaces /

This book presents x-ray and neutron reflectometry techniques and how they can be used to explore interface structure and magnetism at mesoscopic length scale in thin films and multilayers.

Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores principales: Basu, Saibal (Autor), Singh, Surendra (Ph. D. in physics) (Autor)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Bristol [England] (Temple Circus, Temple Way, Bristol BS1 6HG, UK) : IOP Publishing, [2022]
Colección:IOP (Series). Release 22.
IOP ebooks. 2022 collection.
Temas:
Acceso en línea:Texto completo

MARC

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020 |a 9780750346955  |q ebook 
020 |a 9780750346948  |q mobi 
020 |z 9780750346931  |q print 
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024 7 |a 10.1088/978-0-7503-4695-5  |2 doi 
035 |a (CaBNVSL)thg00083544 
035 |a (OCoLC)1358413980 
040 |a CaBNVSL  |b eng  |e rda  |c CaBNVSL  |d CaBNVSL 
050 4 |a QC378  |b .B376 2022eb 
072 7 |a PHM  |2 bicssc 
072 7 |a SCI038000  |2 bisacsh 
082 0 4 |a 621.36028/4  |2 23 
100 1 |a Basu, Saibal,  |e author. 
245 1 0 |a Neutron and x-ray reflectometry :  |b emerging phenomena at heterostructure interfaces /  |c Saibal Basu, Surendra Singh. 
264 1 |a Bristol [England] (Temple Circus, Temple Way, Bristol BS1 6HG, UK) :  |b IOP Publishing,  |c [2022] 
300 |a 1 online resource (various pagings) :  |b illustrations (some color). 
336 |a text  |2 rdacontent 
337 |a electronic  |2 isbdmedia 
338 |a online resource  |2 rdacarrier 
490 1 |a [IOP release $release] 
490 1 |a IOP ebooks. [2022 collection] 
500 |a "Version: 20221201"--Title page verso. 
504 |a Includes bibliographical references. 
505 0 |a 1. Introduction -- 1.1. Interface-driven properties using neutron/x-ray reflectometry -- 1.2. Emerging phenomena at interfaces using polarized neutron reflectometry -- 1.3. Thin-film growth mechanisms -- 1.4. Thin-film deposition techniques -- 1.5. Other complementary surface characterisation techniques 
505 8 |a 2. Theory of neutron reflectometry -- 2.1. Introduction -- 2.2. Optical theory of reflection -- 2.3. Specular NR using unpolarized neutrons -- 2.4. Specular polarized neutron reflectometry -- 2.5. Coherence area and resolution in neutron reflectometry experiments -- 2.6. Off-specular (or diffuse) neutron scattering -- 2.7. Polarized diffuse neutron scattering -- 2.8. Data analysis for reflectometry 
505 8 |a 3. Understanding emerging phenomena at interfaces using specular neutron and x-ray reflectometry -- 3.1. Emerging phenomena at interfaces and characterization -- 3.2. Ferromagnetic metal/semiconductor heterostructures -- 3.3. Interlayer exchange coupling : ferromagnetic metal/nonmagnetic metal heterostructures -- 3.4. Multilayer with noncolinear and chiral magnetic structures -- 3.5. Exchange bias : interface magnetization -- 3.6. Proximity effect and coupling in complex oxide magnetic and superconducting heterostructures -- 3.7. Strain-driven interfacial magnetism in complex oxide heterostructures -- 3.8. Emergent and interface-induced magnetism at complex oxide interfaces -- 3.9. Superdense and nonmagnetic Co phase at interfaces -- 3.10. Tracking interdiffusion and self-diffusion kinetics at interfaces -- 3.11. Proximity-driven magnetic order in topological insulators and interface magnetization in Weyl semimetal -- 3.12. Control of local magnetization in isovalent oxide heterostructures by interface engineering 
505 8 |a 4. Correlation of interface morphology and magnetism in heterostructures : off-specular (diffuse) scattering -- 4.1. Off-specular (diffuse) scattering -- 4.2. Off-specular (diffuse) x-ray scattering -- 4.3. Off-specular (diffuse) neutron scattering -- 5. Summary and outlook. 
520 3 |a This book presents x-ray and neutron reflectometry techniques and how they can be used to explore interface structure and magnetism at mesoscopic length scale in thin films and multilayers. 
521 |a Research students and institutions that are carrying out work in thin film structure and magnetism. 
530 |a Also available in print. 
538 |a Mode of access: World Wide Web. 
538 |a System requirements: Adobe Acrobat Reader, EPUB reader, or Kindle reader. 
545 |a Saibal Basu carried out research in the field of neutron scattering and neutron instrumentation at Dhruva reactor in India for more than three decades. Surendra Singh is a scientist at the Solid State Physics Division, Bhabha Atomic Research Centre, Mumbai. 
588 0 |a Title from PDF title page (viewed on January 9, 2023). 
650 0 |a Thin films  |x Optical properties. 
650 0 |a Neutrons  |x Scattering. 
650 0 |a X-rays  |x Scattering. 
650 0 |a Reflection (Optics) 
650 7 |a Atomic & molecular physics.  |2 bicssc 
650 7 |a SCIENCE / Physics / Magnetism.  |2 bisacsh 
700 1 |a Singh, Surendra  |c (Ph. D. in physics),  |e author. 
710 2 |a Institute of Physics (Great Britain),  |e publisher. 
776 0 8 |i Print version:  |z 9780750346931  |z 9780750346962 
830 0 |a IOP (Series).  |p Release 22. 
830 0 |a IOP ebooks.  |p 2022 collection. 
856 4 0 |u https://iopscience.uam.elogim.com/book/mono/978-0-7503-4695-5  |z Texto completo