Neutron and x-ray reflectometry : emerging phenomena at heterostructure interfaces /

This book presents x-ray and neutron reflectometry techniques and how they can be used to explore interface structure and magnetism at mesoscopic length scale in thin films and multilayers.

Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores principales: Basu, Saibal (Autor), Singh, Surendra (Ph. D. in physics) (Autor)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Bristol [England] (Temple Circus, Temple Way, Bristol BS1 6HG, UK) : IOP Publishing, [2022]
Colección:IOP (Series). Release 22.
IOP ebooks. 2022 collection.
Temas:
Thin films > Optical properties.
Neutrons > Scattering.
X-rays > Scattering.
Reflection (Optics)
Atomic & molecular physics.
SCIENCE / Physics / Magnetism.
Acceso en línea:Texto completo
Descripción
Sumario:This book presents x-ray and neutron reflectometry techniques and how they can be used to explore interface structure and magnetism at mesoscopic length scale in thin films and multilayers.
Notas:"Version: 20221201"--Title page verso.
Descripción Física:1 online resource (various pagings) : illustrations (some color).
Also available in print.
Público:Research students and institutions that are carrying out work in thin film structure and magnetism.
Bibliografía:Includes bibliographical references.
ISBN:9780750346955
9780750346948

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