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Laser beam profiling : cost-effective solutions /

This book provides an overview of lasers, silicon sensors, and practical solutions to beam profiling which has never been presented in a single text. Understanding laser beam characteristics before and after interaction with an object provides intrinsic insights into the nature of the object.

Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores principales: Kallepalli, Akhil (Autor), James, David B. (Ph. D.) (Autor)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Bristol [England] (Temple Circus, Temple Way, Bristol BS1 6HG, UK) : IOP Publishing, [2022]
Colección:IOP (Series). Release 22.
IOP ebooks. 2022 collection.
Temas:
Acceso en línea:Texto completo

MARC

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020 |z 9780750338332  |q print 
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024 7 |a 10.1088/978-0-7503-3835-6  |2 doi 
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040 |a CaBNVSL  |b eng  |e rda  |c CaBNVSL  |d CaBNVSL 
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100 1 |a Kallepalli, Akhil,  |e author. 
245 1 0 |a Laser beam profiling :  |b cost-effective solutions /  |c Akhil Kallepalli, David B. James. 
264 1 |a Bristol [England] (Temple Circus, Temple Way, Bristol BS1 6HG, UK) :  |b IOP Publishing,  |c [2022] 
300 |a 1 online resource (various pagings) :  |b illustrations (some color). 
336 |a text  |2 rdacontent 
337 |a electronic  |2 isbdmedia 
338 |a online resource  |2 rdacarrier 
490 1 |a [IOP release $release] 
490 1 |a IOP ebooks. [2022 collection] 
500 |a "Version: 20220401"--Title page verso. 
504 |a Includes bibliographical references. 
505 0 |a 1. Introduction -- 1.1. Light -- 1.2. Detectors -- 1.3. Benefits of using an imaging system 
505 8 |a 2. Lasers -- 2.1. Light emission, absorption and matter interactions -- 2.2. Properties of lasers and laser light -- 2.3. Laser safety -- 2.4. Additional resources 
505 8 |a 3. Silicon-based imaging systems -- 3.1. Vision -- 3.2. Detectors -- 3.3. Charge-coupled devices (CCD) detectors -- 3.4. Complementary metal-oxide-semiconductor (CMOS) detectors -- 3.5. Detector characteristics -- 3.6. Additional resources 
505 8 |a 4. Experimental techniques -- 4.1. Experimental workflow 
505 8 |a 5. Potential sources of error -- 5.1. Equipment alignment -- 5.2. Sensor saturation -- 5.3. Neutral density filters -- 5.4. Dead pixels -- 5.5. Laser stability -- 5.6. Stray light and background correction -- 6. Conclusions and final remarks. 
520 3 |a This book provides an overview of lasers, silicon sensors, and practical solutions to beam profiling which has never been presented in a single text. Understanding laser beam characteristics before and after interaction with an object provides intrinsic insights into the nature of the object. 
521 |a Interdisciplinary students, researchers, and scientists experimenting using laser systems. Optics students with a need visualise the translation of lasers and sensors from a theoretical to a practical perspective. 
530 |a Also available in print. 
538 |a Mode of access: World Wide Web. 
538 |a System requirements: Adobe Acrobat Reader, EPUB reader, or Kindle reader. 
545 |a Dr. Akhil Kallepalli is a Research Associate in the Optics Group, School of Physics and Astronomy at the University of Glasgow. Dr. David B. James is a Senior Lecturer and Head of the Centre for Electronic Warfare, Information and Cyber. 
588 0 |a Title from PDF title page (viewed on May 8, 2022). 
650 0 |a Semiconductor lasers. 
650 0 |a Optical detectors. 
650 7 |a Optical physics.  |2 bicssc 
650 7 |a Optics and photonics.  |2 bisacsh 
700 1 |a James, David B.  |c (Ph. D.),  |e author. 
710 2 |a Institute of Physics (Great Britain),  |e publisher. 
776 0 8 |i Print version:  |z 9780750338332 
830 0 |a IOP (Series).  |p Release 22. 
830 0 |a IOP ebooks.  |p 2022 collection. 
856 4 0 |u https://iopscience.uam.elogim.com/book/978-0-7503-3835-6  |z Texto completo