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Total internal reflection fluorescence (TIRF) and evanescence microscopies /

This book offers a complete presentation of the physics, math, and experimental setups for both TIRF and related evanescence microscopies. It covers evanescence in both fluorescence excitation or emission. It also discusses, in detail, the theory, setups, and practical biological/biochemical applica...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Axelrod, Daniel, 1948- (Autor)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Bristol [England] (Temple Circus, Temple Way, Bristol BS1 6HG, UK) : IOP Publishing, [2022]
Colección:IOP (Series). Release 22.
Biophysical Society-IOP series.
IOP ebooks. 2022 collection.
Temas:
Acceso en línea:Texto completo
Tabla de Contenidos:
  • 1. Introduction to optical evanescence
  • 1.1. Overview
  • 1.2. Applications to biochemistry and cell biology
  • 1.3. Ray picture of total internal reflection
  • 1.4. Maxwell's equations and wave numbers
  • 1.5. Causes of evanescence : a physical view
  • 2. Total internal reflection theory
  • 2.1. Rays and TIR
  • 2.2. Waves and TIR
  • 2.3. Evanescent intensity
  • 2.4. Finite-width incident beams : the Goos-Hänchen shift
  • 2.5. Reflected intensities
  • 3. Structure in the lower-index material
  • 3.1. Light absorption in medium 1
  • 3.2. Intermediate layers
  • 3.3. Metal films and surface plasmons
  • 3.4. Slab waveguides
  • 3.5. Total internal reflection scattering
  • 4. Emission of fluorophores near a surface
  • 4.1. The emission near field : a semi-qualitative view
  • 4.2. Capture of the near field : summary of quantitative theory
  • 4.3. Polarization of the emitted electric field
  • 4.4. Emitted intensity and total power
  • 4.5. Emitted intensity vs polar angle
  • 4.6. Total fluorescence collection through a microscope objective
  • 4.7. Pattern at the back focal plane
  • 4.8. Characterization of films with supercritical-emission light
  • 4.9. Effect of metal films on fluorescence emission
  • 4.10. Pattern at the image plane
  • 4.11. Virtual supercritical angle fluorescence microscopy (vSAF)
  • 4.12. Emission polarization including supercritical light
  • 4.13. SAF/UAF : measurement of the absolute distance between a fluorophore and a surface
  • 4.14. Effect of near-field capture on fluorescence lifetime
  • 5 Optical configurations and setup
  • 5.1. Inverted microscope TIR with prism above
  • 5.2. Inverted microscope TIR with prism below
  • 5.3. Upright microscope TIR with prism below
  • 5.4. Objective-based TIR
  • 5.5. Incidence angle, multicolor, and polarization control
  • 5.6. Alignment
  • 5.7. Rapid chopping between TIR and epi-illumination
  • 5.8. Supercritical-angle fluorescence (SAF) emission setup
  • 5.9. Imaging the back focal plane directly
  • 5.10. Measurement of evanescent field depth
  • 5.11. TIRF-structured illumination microscopy (TIRF-SIM)
  • 6. Applications of TIRF microscopy and its combination with other fluorescence techniques
  • 6.1. Refractive indices in cell cultures
  • 6.2. Axial position and motion of cell components
  • 6.3. Quenching with a metal film
  • 6.4. Image sharpening in TIR
  • 6.5. Polarized excitation TIRF
  • 6.6. Variable-depth TIRF
  • 6.7. Optical force in an evanescent field
  • 6.8. TIR/FCS and TIR/FRAP
  • 6.9. TIR-continuous photobleaching
  • 6.10. TIR-FRET
  • 6.11. Two-photon TIRF.