CMOS image sensors /
This book explores the operating principles of complementary metal oxide semiconductor (CMOS) image sensors, their architecture, readout circuits, and characterisation techniques.
Clasificación: | Libro Electrónico |
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Autor principal: | |
Formato: | Electrónico eBook |
Idioma: | Inglés |
Publicado: |
Bristol [England] (Temple Circus, Temple Way, Bristol BS1 6HG, UK) :
IOP Publishing,
[2022]
|
Colección: | IOP (Series). Release 22.
IOP ebooks. 2022 collection. |
Temas: | |
Acceso en línea: | Texto completo |
Tabla de Contenidos:
- 1. The fundamentals
- 1.1. Introduction--what is an image sensor and what does it do?
- 1.2. Charge generation
- 1.3. Charge collection
- 1.4. Charge transfer
- 1.5. Charge conversion
- 1.6. pn junction
- 1.7. MOS capacitor
- 1.8. MOS transistor
- 1.9. Source follower
- 2. CMOS pixel architectures
- 2.1. History and technology
- 2.2. Photodiode APS
- 2.3. Pinned photodiode (4T)
- 2.4. Other PPD-based pixels
- 2.5. Hybrid and 3D image sensors
- 3. Advanced image sensor topics
- 3.1. Photocurrent
- 3.2. Dark current
- 3.3. Reflective barrier
- 3.4. Back-side illumination
- 3.5. Depletion depth and potential gradients
- 3.6. Punch-through
- 3.7. Field-induced junctions
- 4. Noise and readout techniques
- 4.1. Noise in image sensors
- 4.2. Correlated double sampling
- 5. Characterisation
- 5.1. Introduction
- 5.2. Readout modes
- 5.3. Principles of EO characterisation
- 5.4. Photoresponse, non-uniformity and nonlinearity
- 5.5. Photon transfer curve
- 5.6. X-ray calibration
- 5.7. Full well capacity and dynamic range
- 5.8. Dark current and DSNU
- 5.9. Noise measurement
- 5.10. Image lag
- 5.11. Quantum efficiency
- 5.12. Electrical transfer function
- 6. Electronics
- 6.1. On-chip electronics
- 6.2. Off-chip electronics.