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CMOS image sensors /

This book explores the operating principles of complementary metal oxide semiconductor (CMOS) image sensors, their architecture, readout circuits, and characterisation techniques.

Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Stefanov, Konstantin D. (Autor)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Bristol [England] (Temple Circus, Temple Way, Bristol BS1 6HG, UK) : IOP Publishing, [2022]
Colección:IOP (Series). Release 22.
IOP ebooks. 2022 collection.
Temas:
Acceso en línea:Texto completo

MARC

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024 7 |a 10.1088/978-0-7503-3235-4  |2 doi 
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035 |a (OCoLC)1353822961 
040 |a CaBNVSL  |b eng  |e rda  |c CaBNVSL  |d CaBNVSL 
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100 1 |a Stefanov, Konstantin D.,  |e author. 
245 1 0 |a CMOS image sensors /  |c Konstantin D. Stefanov. 
264 1 |a Bristol [England] (Temple Circus, Temple Way, Bristol BS1 6HG, UK) :  |b IOP Publishing,  |c [2022] 
300 |a 1 online resource (various pagings) :  |b illustrations (some color). 
336 |a text  |2 rdacontent 
337 |a electronic  |2 isbdmedia 
338 |a online resource  |2 rdacarrier 
490 1 |a [IOP release $release] 
490 1 |a IOP ebooks. [2022 collection] 
500 |a "Version: 20221201"--Title page verso. 
504 |a Includes bibliographical references. 
505 0 |a 1. The fundamentals -- 1.1. Introduction--what is an image sensor and what does it do? -- 1.2. Charge generation -- 1.3. Charge collection -- 1.4. Charge transfer -- 1.5. Charge conversion -- 1.6. pn junction -- 1.7. MOS capacitor -- 1.8. MOS transistor -- 1.9. Source follower 
505 8 |a 2. CMOS pixel architectures -- 2.1. History and technology -- 2.2. Photodiode APS -- 2.3. Pinned photodiode (4T) -- 2.4. Other PPD-based pixels -- 2.5. Hybrid and 3D image sensors 
505 8 |a 3. Advanced image sensor topics -- 3.1. Photocurrent -- 3.2. Dark current -- 3.3. Reflective barrier -- 3.4. Back-side illumination -- 3.5. Depletion depth and potential gradients -- 3.6. Punch-through -- 3.7. Field-induced junctions 
505 8 |a 4. Noise and readout techniques -- 4.1. Noise in image sensors -- 4.2. Correlated double sampling 
505 8 |a 5. Characterisation -- 5.1. Introduction -- 5.2. Readout modes -- 5.3. Principles of EO characterisation -- 5.4. Photoresponse, non-uniformity and nonlinearity -- 5.5. Photon transfer curve -- 5.6. X-ray calibration -- 5.7. Full well capacity and dynamic range -- 5.8. Dark current and DSNU -- 5.9. Noise measurement -- 5.10. Image lag -- 5.11. Quantum efficiency -- 5.12. Electrical transfer function 
505 8 |a 6. Electronics -- 6.1. On-chip electronics -- 6.2. Off-chip electronics. 
520 3 |a This book explores the operating principles of complementary metal oxide semiconductor (CMOS) image sensors, their architecture, readout circuits, and characterisation techniques. 
521 |a Physicists and engineers in image sensor characterisation, development and research. 
530 |a Also available in print. 
538 |a Mode of access: World Wide Web. 
538 |a System requirements: Adobe Acrobat Reader, EPUB reader, or Kindle reader. 
545 |a Dr. Konstantin Stefanov is a Senior Research Fellow at the Centre for Electronic Imaging at The Open University, UK, and has over 20 years of experience in the field of CMOS and CCD image sensors, including characterisation, simulations, and design.  
588 0 |a Title from PDF title page (viewed on December 5, 2022). 
650 0 |a Metal oxide semiconductors, Complementary. 
650 0 |a Image processing  |x Digital techniques. 
650 7 |a Instruments & instrumentation engineering.  |2 bicssc 
650 7 |a TECHNOLOGY & ENGINEERING / Sensors.  |2 bisacsh 
710 2 |a Institute of Physics (Great Britain),  |e publisher. 
776 0 8 |i Print version:  |z 9780750332330  |z 9780750332361 
830 0 |a IOP (Series).  |p Release 22. 
830 0 |a IOP ebooks.  |p 2022 collection. 
856 4 0 |u https://iopscience.uam.elogim.com/book/mono/978-0-7503-3235-4  |z Texto completo