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Modern interferometry for length metrology : exploring limits and novel techniques /
Modern Interferometry for Length Metrology: Exploring limits and novel techniques gives an overview of refined traditional methods and novel techniques in the fields of length and distance metrology. The representation of a length according to the definition of the meter in the International System...
| Clasificación: | Libro Electrónico |
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| Otros Autores: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Bristol [England] (Temple Circus, Temple Way, Bristol BS1 6HG, UK) :
IOP Publishing,
[2018]
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| Colección: | IOP (Series). Release 6.
IOP expanding physics. |
| Temas: | |
| Acceso en línea: | Texto completo |
| Sumario: | Modern Interferometry for Length Metrology: Exploring limits and novel techniques gives an overview of refined traditional methods and novel techniques in the fields of length and distance metrology. The representation of a length according to the definition of the meter in the International System of Units requires a measurement principle which establishes a relation between the travelling time of light in vacuum and the length to be measured. This comprehensive book covers the basic concepts of length metrology, sophisticated methods to reach smallest measurement uncertainties in length measurements and describes innovative interferometer concepts. Aimed at students, researchers and practitioners in the field, this book will provide a far-reaching audience with key data and novel techniques enabling them to better apply and understand interferometry and length metrology. |
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| Notas: | "Version: 20181201"--Title page verso. |
| Descripción Física: | 1 online resource (various pagings) : illustrations (chiefly color). Also available in print. |
| Bibliografía: | Includes bibliographical references. |
| ISBN: | 9780750315784 9780750315777 |
| ISSN: | 2053-2563 |