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00000nam a2200000 i 4500 |
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ELB120272 |
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FINmELB |
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20200820162738.0 |
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m o u |
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cr cn||||||||| |
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200219s2018 enk o 000 0 eng d |
| 020 |
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|a 9781527523425
|q (e-book)
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| 020 |
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|z 9781527506350
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| 035 |
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|a (OCoLC)1079759430
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| 040 |
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|a FINmELB
|b eng
|e rda
|c FINmELB
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| 050 |
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4 |
|a TK7871.85
|b .T353 2018
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| 082 |
0 |
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|a 537.6225
|2 23
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| 100 |
1 |
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|a Talanin, V. I.,
|e author.
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| 245 |
1 |
4 |
|a The formation of structural imperfections in semiconductor silicon /
|c by V. I. Talanin and I. E. Talanin.
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| 264 |
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|a Newcastle-upon-Tyne, England :
|b Cambridge Scholars Publishing,
|c 2018.
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| 300 |
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|a 1 online resource (281 pages)
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| 336 |
|
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|a text
|b txt
|2 rdacontent
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| 337 |
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|a computer
|b c
|2 rdamedia
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| 338 |
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|a online resource
|b cr
|2 rdacarrier
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| 588 |
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|a Description based on metadata supplied by the publisher and other sources.
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| 590 |
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|a Electronic reproduction. Santa Fe, Arg.: elibro, 2020. Available via World Wide Web. Access may be limited to eLibro affiliated libraries.
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| 650 |
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|a Silicon
|x Structure.
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| 650 |
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0 |
|a Semiconductors
|x Impurity distribution.
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| 650 |
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0 |
|a Semiconductors
|x Materials.
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| 655 |
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4 |
|a Electronic books.
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| 700 |
1 |
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|a Talanin, I. E.,
|e author.
|
| 797 |
2 |
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|a elibro, Corp.
|
| 856 |
4 |
0 |
|u https://elibro.uam.elogim.com/ereader/bidiuam/120272
|z Texto completo
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| 950 |
|
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|a eLibro English
|
